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Autor:
Hines NR; Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87131, USA., Patel S; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Scoglietti D; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Gilmore M; Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87131, USA., Billingsley SL; Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87131, USA., Dwyer RH; Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87131, USA., Awe T; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Armstrong D; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Bliss D; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Laity G; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Cuneo M; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2022 Nov 01; Vol. 93 (11), pp. 113505.