Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths

Autor: Lv, P., Cao, G. F., Wen, L. J., Kharusi, S. Al, Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, L., Chambers, C., Chana, B., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Croix, A. De St., Der Mesrobian-Kabakian, A., Deslandes, K., DeVoe, R., Di Vacri, M. L., Dilling, J., Ding, Y. Y., Dolinski, M. J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leach, K. G., Lenardo, B. G., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D. C., Murray, K., Nakarmi, P., Natzke, C. R., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rescia, S., Retière, F., Richman, M., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J. -L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Watkins, J., Wei, W., Wichoski, U., Wu, S. X., Wu, W. H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., Ziegler, T.

Characterization of the vacuum ultraviolet (VUV) reflectance of silicon photomultipliers (SiPMs) is important for large-scale SiPM-based photodetector systems. We report the angular dependence of the specular reflectance in a vacuum of SiPMs manufact

Externí odkaz: http://arxiv.org/abs/1912.01841

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in Liquid Xenon

Autor: Nakarmi, P., Ostrovskiy, I., Soma, A. K., Retiere, F., Kharusi, S. Al, Alfaris, M., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Blatchford, J., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, G. F., Cao, L., Chambers, C., Chana, B., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Croix, A. De St., Der Mesrobian-Kabakian, A., DeVoe, R., Di Vacri, M. L., Dilling, J., Ding, Y. Y., Dolinski, M. J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hößle, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leach, K. G., Lenardo, B. G., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., Lv, P., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D. C., Murray, K., Natzke, C. R., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, l J. L., Ortega, G. S., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rescia, S., Richman, M., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, St-Hilaire, G., Stekhanov, r V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J. -L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wen, L. J., Wichoski, U., Wu, S. X., Wu, W. H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., Ziegler, T.

Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter,

Externí odkaz: http://arxiv.org/abs/1910.06438

Characterization of the Hamamatsu VUV4 MPPCs for nEXO

Autor: Gallina, G., Giampa, P., Retiere, F., Kroeger, J., Zhang, G., Ward, M., Margetak, P., Lic, G., Tsang, T., Doria, L., Kharusi, S. Al, Alfaris, M., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Blatchford, J., Brodsky, J. P., Brown, E., Brunner, T., Cao, G. F., Cao, L., Cen, W. R., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S. J., Croix, A. De St., Der Mesrobian-Kabakian, A., DeVoe, R., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Echevers, J., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Gautam, P., Giacomini, G., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hoßl, J., House, A., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Kodroff, D., Koffas, T., Krucken, R., Kuchenkov, A., Kumar, K. S., Lana, Y., Larson, A., Lenardo, B. G., Leonarda, D. S., Lik, S., Li, Z., Licciardi, C., Linw, Y. H., Lv, P., MacLellan, R., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D. C., Murray, K., Nakarmi, P., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepkez, A., Pocar, A., Pratte, J. -F., Qiu, D., Radeka, V., Raguzin, E., Rescia, S., Richman, M., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Totev, T. I., Tsang, R., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Walent, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wen, L. J., Wichoski, U., Wu, S. X., Wu, W. H., Wu, X., Xia, Q., Yang, H., Yang, L., Yen, Y. -R., Zeldovich, O., Zhao, J., Zhou, Y., Ziegler, T.

In this paper we report on the characterization of the Hamamatsu VUV4 (S/N: S13370-6152) Vacuum Ultra-Violet (VUV) sensitive Silicon Photo-Multipliers (SiPMs) as part of the development of a solution for the detection of liquid xenon scintillation li

Externí odkaz: http://arxiv.org/abs/1903.03663

Imaging individual barium atoms in solid xenon for barium tagging in nEXO

Autor: Chambers, C., Walton, T., Fairbank, D., Craycraft, A., Yahne, D. R., Todd, J., Iverson, A., Fairbank, W., Alamare, A., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Cen, W. R., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Cree, W., Côté, M., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S. J., Daughhetee, J., Delaquis, S., Der Mesrobian-Kabakian, A., DeVoe, R., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Echevers, J., Fabris, L., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Jamil, A., Jessiman, C., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y. H., Lv, P., MacLellan, R., Michel, T., Mong, B., Moore, D. C., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Schubert, A., Sinclair, D., VIII, K. Skarpaas, Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Tolba, T., Tsang, T. I. Totev. R., Tsang, T., Vachon, F., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wen, L. J., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Xia, Q., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., Ziegler, T.

The search for neutrinoless double beta decay probes the fundamental properties of neutrinos, including whether or not the neutrino and antineutrino are distinct. Double beta detectors are large and expensive, so background reduction is essential for

Externí odkaz: http://arxiv.org/abs/1806.10694

nEXO Pre-Conceptual Design Report

Autor: nEXO Collaboration, Kharusi, S. Al, Alamre, A., Albert, J. B., Alfaris, M., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Cen, W. R., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Conley, R., Coon, M., Côté, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Danovitch, D., Darroch, L., Daugherty, S. J., Daughhetee, J., DeVoe, R., Delaquis, S., Der Mesrobian-Kabakian, A., Di Vacri, M. L., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fierlinger, P., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Haller, G., Hansen, E. V., Harris, D., Hasi, J., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jessiman, C., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Kenney, C., Killick, R., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Lenardo, B. G., Leonard, D. S., Lewis, C. M., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y. H., Lv, P., MacLellan, R., McFarlane, K., Michel, T., Mong, B., Moore, D. C., Murray, K., Newby, R. J., Nguyen, T., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Patel, M., Peña-Perez, A., Piepke, A., Pocar, A., Pratte, J. -F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Schubert, A., Segal, J., Skarpaas~VIII, K., Soma, A. K., Spitaels, K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veenstra, B., Veeraraghavan, V., Visser, G., Vogel, P., Vuilleumier, J. -L., Wagenpfeil, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wen, L. J., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Xia, Q., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., Ziegler, T.

The projected performance and detector configuration of nEXO are described in this pre-Conceptual Design Report (pCDR). nEXO is a tonne-scale neutrinoless double beta ($0\nu\beta\beta$) decay search in $^{136}$Xe, based on the ultra-low background li

Externí odkaz: http://arxiv.org/abs/1805.11142