Zobrazeno 1 - 10
of 61
pro vyhledávání: '"Hight Walker AR"'
Autor:
Abel FM; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Correa EL; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States.; Theiss Research, La Jolla, California 92037, United States., Bui TQ; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Biacchi AJ; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Donahue MJ; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Merritt MT; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States.; Morgan State University, Baltimore, Maryland 21251, United States., Seppala JE; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Woods SI; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Hight Walker AR; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Dennis CL; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 Oct 09; Vol. 16 (40), pp. 54328-54343. Date of Electronic Publication: 2024 Sep 25.
Autor:
Samanta S; Department of Physics, The University of Texas at El Paso, El Paso, Texas 79968, United States., Iturriaga H; Department of Physics, The University of Texas at El Paso, El Paso, Texas 79968, United States., Mai TT; Quantum Measurement Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Biacchi AJ; Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Islam R; Department of Physics, University of Alabama at Birmingham, Birmingham, Alabama 35233, United States., Fullerton J; Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States., Hight Walker AR; Quantum Measurement Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Noufal M; Department of Chemical Engineering, Hampton University, Hampton, Virginia 23668, United States., Siebenaller R; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433, United States.; Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, United States., Rowe E; Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, United States.; National Research Council, Washington, D.C. 20001, United States.; Department of Engineering Technology, Middle Tennessee State University, Murfreesboro, Tennessee 37132, United States.; Department of Astronomy and Physics, Vanderbilt University, Nashville, Tennessee 37235, United States.; Department of Life and Physical Sciences, Fisk University, Nashville, Tennessee 37208, United States., Phatak C; Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States.; Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States., Susner MA; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433, United States., Xue F; Department of Physics, University of Alabama at Birmingham, Birmingham, Alabama 35233, United States., Singamaneni SR; Department of Physics, The University of Texas at El Paso, El Paso, Texas 79968, United States.
Publikováno v:
Nano letters [Nano Lett] 2024 Jul 31; Vol. 24 (30), pp. 9169-9177. Date of Electronic Publication: 2024 Jul 18.
Autor:
Amontree J; Department of Mechanical Engineering, Columbia University, New York, NY, USA., Yan X; Department of Mechanical Engineering, Columbia University, New York, NY, USA., DiMarco CS; Department of Mechanical Engineering, Columbia University, New York, NY, USA., Levesque PL; Infinite Potential Laboratories, Waterloo, Ontario, Canada.; Département de Chimie, Université de Montréal, Montréal, Quebec, Canada.; Institut Courtois, Université de Montréal, Montréal, Quebec, Canada., Adel T; Quantum Metrology Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA., Pack J; Department of Physics, Columbia University, New York, NY, USA., Holbrook M; Department of Physics, Columbia University, New York, NY, USA., Cupo C; Department of Mechanical Engineering, Columbia University, New York, NY, USA., Wang Z; Department of Mechanical Engineering, Columbia University, New York, NY, USA., Sun D; Department of Physics, Columbia University, New York, NY, USA., Biacchi AJ; Nanoscale Device Characterization Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA., Wilson-Stokes CE; Quantum Metrology Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA.; Department of Mechanical Engineering, Howard University, Washington, DC, USA., Watanabe K; Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Japan., Taniguchi T; Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Japan., Dean CR; Department of Physics, Columbia University, New York, NY, USA., Hight Walker AR; Quantum Metrology Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA., Barmak K; Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, USA. kb2612@columbia.edu., Martel R; Département de Chimie, Université de Montréal, Montréal, Quebec, Canada. r.martel@umontreal.ca.; Institut Courtois, Université de Montréal, Montréal, Quebec, Canada. r.martel@umontreal.ca., Hone J; Department of Mechanical Engineering, Columbia University, New York, NY, USA. jh2228@columbia.edu.
Publikováno v:
Nature [Nature] 2024 Jun; Vol. 630 (8017), pp. 636-642. Date of Electronic Publication: 2024 May 29.
Autor:
Raciti D; Material Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Cockayne E; Material Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Vinson J; Material Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Schwarz K; Material Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Hight Walker AR; Physical Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Moffat TP; Material Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States.
Publikováno v:
Journal of the American Chemical Society [J Am Chem Soc] 2024 Jan 17; Vol. 146 (2), pp. 1588-1602. Date of Electronic Publication: 2024 Jan 03.
Autor:
Erodici MP; Department of Chemistry, University of California, Berkeley, California 94720, United States., Mai TT; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Xie LS; Department of Chemistry, University of California, Berkeley, California 94720, United States., Li S; Department of Chemistry, University of California, Berkeley, California 94720, United States., Fender SS; Department of Chemistry, University of California, Berkeley, California 94720, United States., Husremović S; Department of Chemistry, University of California, Berkeley, California 94720, United States., Gonzalez O; Department of Chemistry, University of California, Berkeley, California 94720, United States., Hight Walker AR; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Bediako DK; Department of Chemistry, University of California, Berkeley, California 94720, United States.; Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
Publikováno v:
The journal of physical chemistry. C, Nanomaterials and interfaces [J Phys Chem C Nanomater Interfaces] 2023 May 10; Vol. 127 (20), pp. 9787-9795. Date of Electronic Publication: 2023 May 10 (Print Publication: 2023).
Autor:
Mullangi D; Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, 117575 Singapore., Evans HA; Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Yildirim T; Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Wang Y; Department of Chemical and Biomolecular Engineering, National University of Singapore, 4 Engineering Drive 4, 117585 Singapore., Deng Z; Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, 117575 Singapore., Zhang Z; Department of Chemical and Biomolecular Engineering, National University of Singapore, 4 Engineering Drive 4, 117585 Singapore., Mai TT; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Wei F; Institute of Materials Research and Engineering, Agency for Science Technology and Research, 2 Fusionopolis Way, Innovis, 138634 Singapore., Wang J; Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, 117575 Singapore., Hight Walker AR; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Brown CM; Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.; Department of Chemical and Biomolecular Engineering, University of Delaware, Newark, Delaware 19716, United States., Zhao D; Department of Chemical and Biomolecular Engineering, National University of Singapore, 4 Engineering Drive 4, 117585 Singapore., Canepa P; Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, 117575 Singapore.; Department of Chemical and Biomolecular Engineering, National University of Singapore, 4 Engineering Drive 4, 117585 Singapore., Cheetham AK; Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, 117575 Singapore.; Materials Research Laboratory, University of California, Santa Barbara, Santa Barbara, California 93106, United States.
Publikováno v:
Journal of the American Chemical Society [J Am Chem Soc] 2023 May 03; Vol. 145 (17), pp. 9850-9856. Date of Electronic Publication: 2023 Apr 21.
Autor:
Abel FM; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Correa EL; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Biacchi AJ; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Bui TQ; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Woods SI; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Hight Walker AR; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Dennis CL; National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Mar 15; Vol. 15 (10), pp. 13439-13448. Date of Electronic Publication: 2023 Mar 06.
Autor:
Lin Z; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Beltran LC; Department of Biochemistry and Molecular Genetics, University of Virginia, Charlottesville, VA 22908, USA., De Los Santos ZA; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Li Y; South China Advanced Institute for Soft Matter Science and Technology, School of Emergent Soft Matter, South China University of Technology, Guangzhou 510640, China., Adel T; Quantum Metrology Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Fagan JA; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Hight Walker AR; Quantum Metrology Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Egelman EH; Department of Biochemistry and Molecular Genetics, University of Virginia, Charlottesville, VA 22908, USA., Zheng M; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
Science (New York, N.Y.) [Science] 2022 Jul 29; Vol. 377 (6605), pp. 535-539. Date of Electronic Publication: 2022 Jul 28.
Autor:
Chowdhury S; Department of Physics and Astronomy, Howard University, Washington, DC 20059, USA.; Material Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA., Rigosi AF; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA., Hill HM; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA.; Physics Today, American Institute of Physics, College Park, MD 20740, USA., Vora P; Quantum Science and Engineering Center, George Mason University, Fairfax, VA 22030, USA.; Department of Physics and Astronomy, George Mason University, Fairfax, VA 22030, USA., Hight Walker AR; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA., Tavazza F; Material Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA.; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA.
Publikováno v:
Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2022 Feb 01; Vol. 12 (3). Date of Electronic Publication: 2022 Feb 01.
Autor:
Tackett BM; Materials Science and Engineering Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Raciti D; Materials Science and Engineering Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Hight Walker AR; Nanoscale Device Characterization Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Moffat TP; Materials Science and Engineering Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States.
Publikováno v:
The journal of physical chemistry letters [J Phys Chem Lett] 2021 Nov 11; Vol. 12 (44), pp. 10936-10941. Date of Electronic Publication: 2021 Nov 04.