Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Highland, MJ"'
Autor:
Chen, F, Zhu, Y, Liu, S, Qi, Y, Hwang, HY, Brandt, NC, Lu, J, Quirin, F, Enquist, H, Zalden, P, Hu, T, Goodfellow, J, Sher, MJ, Hoffmann, MC, Zhu, D, Lemke, H, Glownia, J, Chollet, M, Damodaran, AR, Park, J, Cai, Z, Jung, IW, Highland, MJ, Walko, DA, Freeland, JW, Evans, PG, Vailionis, A, Larsson, J, Nelson, KA, Rappe, AM, Sokolowski-Tinten, K, Martin, LW, Wen, H, Lindenberg, AM
Publikováno v:
Physical Review B, vol 97, iss 22
Chen, F; Zhu, Y; Liu, S; Qi, Y; Hwang, HY; Brandt, NC; et al.(2018). Reply to "comment on 'Ultrafast terahertz-field-driven ionic response in ferroelectric BaTiO3 ' ". Physical Review B, 97(22). doi: 10.1103/PhysRevB.97.226102. UC Berkeley: Retrieved from: http://www.escholarship.org/uc/item/4vj5h11r
Chen, F; Zhu, Y; Liu, S; Qi, Y; Hwang, HY; Brandt, NC; et al.(2018). Reply to "comment on 'Ultrafast terahertz-field-driven ionic response in ferroelectric BaTiO3 ' ". Physical Review B, 97(22). doi: 10.1103/PhysRevB.97.226102. UC Berkeley: Retrieved from: http://www.escholarship.org/uc/item/4vj5h11r
© 2018 American Physical Society. In this reply to S. Durbin's comment on our original paper "Ultrafast terahertz-field-driven ionic response in ferroelectric BaTiO3," we concur that his final equations 8 and 9 more accurately describe the change in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::db42c9cc088f90e833a589045707e50d
https://escholarship.org/uc/item/4vj5h11r
https://escholarship.org/uc/item/4vj5h11r
Autor:
Zhu, Y, Chen, F, Park, J, Sasikumar, K, Hu, B, Damodaran, AR, Jung, IW, Highland, MJ, Cai, Z, Tung, IC, Walko, DA, Freeland, JW, Martin, LW, Sankaranarayanan, SKRS, Evans, PG, Lindenberg, AM, Wen, H
Publikováno v:
Physical Review Materials, vol 1, iss 6
Nanoscale phonon transport is a key process that governs thermal conduction in a wide range of materials and devices. Creating controlled phonon populations by resonant excitation at terahertz (THz) frequencies can drastically change the characterist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::b5ab576e3eda09a4d22510bb945d6600
https://escholarship.org/uc/item/7334c1s8
https://escholarship.org/uc/item/7334c1s8
Autor:
Frith MG; Argonne National Laboratory, 9700 S Cass Ave., Lemont, Illinois 60439, USA., Highland MJ; Argonne National Laboratory, 9700 S Cass Ave., Lemont, Illinois 60439, USA., Qiao Z; Argonne National Laboratory, 9700 S Cass Ave., Lemont, Illinois 60439, USA., Rebuffi L; Argonne National Laboratory, 9700 S Cass Ave., Lemont, Illinois 60439, USA., Assoufid L; Argonne National Laboratory, 9700 S Cass Ave., Lemont, Illinois 60439, USA., Shi X; Argonne National Laboratory, 9700 S Cass Ave., Lemont, Illinois 60439, USA.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2023 Dec 01; Vol. 94 (12).
Autor:
Rebuffi L, Kandel S, Shi X, Zhang R, Harder RJ, Cha W, Highland MJ, Frith MG, Assoufid L, Cherukara MJ
Publikováno v:
Optics express [Opt Express] 2023 Nov 20; Vol. 31 (24), pp. 39514-39527.
Publikováno v:
Optics express [Opt Express] 2023 Jun 19; Vol. 31 (13), pp. 21264-21279.
Autor:
Sheyfer D; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States.; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Mariano RG; Department of Chemistry, Stanford University, Stanford, California94305, United States.; Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts02141, United States., Kawaguchi T; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States.; Institute for Materials Research, Tohoku University, Sendai, 9808577, Japan., Cha W; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Harder RJ; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Kanan MW; Department of Chemistry, Stanford University, Stanford, California94305, United States., Hruszkewycz SO; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., You H; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Highland MJ; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States.
Publikováno v:
Nano letters [Nano Lett] 2023 Jan 11; Vol. 23 (1), pp. 1-7. Date of Electronic Publication: 2022 Dec 21.
Autor:
Bertaux N, Allain M, Weizeorick J, Park JS, Kenesei P, Shastri SD, Almer J, Highland MJ, Maddali S, Hruszkewycz SO
Publikováno v:
Optics express [Opt Express] 2021 Oct 25; Vol. 29 (22), pp. 35003-35021.
Autor:
Ju G; Materials Science Division, Argonne National Laboratory, Lemont, IL, USA. juguangxu@gmail.com.; Lumileds Lighting Co., San Jose, CA, USA. juguangxu@gmail.com., Xu D; Materials Science Division, Argonne National Laboratory, Lemont, IL, USA.; School of Energy and Power Engineering, Huazhong University of Science and Technology, Wuhan, Hubei, China., Thompson C; Department of Physics, Northern Illinois University, DeKalb, IL, USA., Highland MJ; X-ray Science Division, Argonne National Laboratory, Lemont, IL, USA., Eastman JA; Materials Science Division, Argonne National Laboratory, Lemont, IL, USA., Walkosz W; Department of Physics, Lake Forest College, Lake Forest, IL, USA., Zapol P; Materials Science Division, Argonne National Laboratory, Lemont, IL, USA., Stephenson GB; Materials Science Division, Argonne National Laboratory, Lemont, IL, USA. stephenson@anl.gov.
Publikováno v:
Nature communications [Nat Commun] 2021 Mar 19; Vol. 12 (1), pp. 1721. Date of Electronic Publication: 2021 Mar 19.
Autor:
Marks SD; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Quan P; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Liu R; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Highland MJ; X-ray Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA., Zhou H; X-ray Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA., Kuech TF; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Stephenson GB; Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA., Evans PG; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2021 Feb 01; Vol. 92 (2), pp. 023908.
Autor:
Ju G; Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA., Highland MJ; Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA., Thompson C; Department of Physics, Northern Illinois University, DeKalb, IL 60115, USA., Eastman JA; Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA., Fuoss PH; Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA., Zhou H; X-ray Science Division, Argonne National Laboratory, Argonne, IL 60439, USA., Dejus R; Accelerator Systems Division, Argonne National Laboratory, Argonne, IL 60439, USA., Stephenson GB; Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
Publikováno v:
Journal of synchrotron radiation [J Synchrotron Radiat] 2018 Jul 01; Vol. 25 (Pt 4), pp. 1036-1047. Date of Electronic Publication: 2018 Jun 13.