Zobrazeno 1 - 10
of 181
pro vyhledávání: '"Higashi, G"'
Publikováno v:
The Journal of Parasitology, 1989 Dec 01. 75(6), 942-945.
Externí odkaz:
https://www.jstor.org/stable/3282874
Autor:
Higashi, G. I., Farid, Z.
Publikováno v:
The British Medical Journal, 1979 Oct 01. 2(6194), 830-830.
Externí odkaz:
https://www.jstor.org/stable/25437167
Autor:
Higashi, G. S.
Publikováno v:
Journal of Chemical Physics; 1/1/1988, Vol. 88 Issue 1, p422, 5p
Publikováno v:
Journal of Applied Physics; 5/15/1992, Vol. 71 Issue 10, p4983, 8p
Autor:
Green, M. L., Weir, B. E., Brasen, D., Hsieh, Y. F., Higashi, G., Feygenson, A., Feldman, L. C., Headrick, R. L.
Publikováno v:
Journal of Applied Physics; 1/15/1991, Vol. 69 Issue 2, p745, 7p, 2 Black and White Photographs, 1 Chart, 6 Graphs
Publikováno v:
Journal of Applied Physics; 8/1/1995, Vol. 78 Issue 3, p1650, 9p, 2 Diagrams, 4 Graphs
Autor:
Dawson, J. L., Krisch, K., Evans-Lutterodt, K. W., Tang, Mau-Tsu, Manchanda, L., Green, M. L., Brasen, D., Higashi, G. S., Boone, T.
Publikováno v:
Journal of Applied Physics; 5/1/1995, Vol. 77 Issue 9, p4746, 4p, 2 Charts, 4 Graphs
Publikováno v:
Scanning Microscopy
The vacuum tunneling microscope has been extensively utilized in the study of the surface atomic configuration of conducting materials. Analysis of features in both the tunneling images and in the tunnel junction I-V characteristic yields insight int
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::9bf8244861a88fe998c62b75fbfbedc3
https://digitalcommons.usu.edu/context/microscopy/article/1395/viewcontent/WDCcenterscan1993BeckerChabalHigashi_SurfaceChemicalReactions.pdf
https://digitalcommons.usu.edu/context/microscopy/article/1395/viewcontent/WDCcenterscan1993BeckerChabalHigashi_SurfaceChemicalReactions.pdf
Autor:
Nouri, F., Kher, S., Narwankar, P., Sharangpani, R., Muthukrishnan, S., Kraus, P., Ahmed, K., Olsen, C., Thai Cheng Chua, Cruse, J., Hung, S., Sang Ho Bae, Kang, A., Higashi, G., Miner, G.
Publikováno v:
2004 International Conference on Integrated Circuit Design & Technology (IEEE Cat. No.04EX866); 2004, p275-281, 7p
Autor:
Kizilyalli, I.C., Weber, G., Chen, Z., Abeln, G., Schonfield, M., Kotzias, B., Register, F., Harris, E., Sen, S., Chetlur, S., Patel, M., Stirling, L., Huang, R., Massengale, A., Roy, P.K., Higashi, G., Foley, E., Lee, J., Lyding, J., Hess, K.
Publikováno v:
International Electron Devices Meeting 1998 Technical Digest (Cat No98CH36217); 1998, p935-938, 4p