Zobrazeno 1 - 10
of 72
pro vyhledávání: '"Hidetoshi TAKEDA"'
Publikováno v:
Nihon Kikai Gakkai ronbunshu, Vol 80, Iss 815, Pp SMM0185-SMM0185 (2014)
In this study, for the matrix / fiber interface strength is investigated in the fatigue experiment for the glass-fiber reinforcing polycarbonate (GFPC). Here the effect of modified PC resin is discussed when Epoxy (EP) or Polydimethylsiloxane (PDMS)
Externí odkaz:
https://doaj.org/article/050b9e8aff3546318b71a305448d4ff2
Publikováno v:
Nihon Kikai Gakkai ronbunshu, Vol 80, Iss 814, Pp SMM0149-SMM0149 (2014)
In this study, high-speed tensile testing for notched specimen is conducted to investigate the impact property of Polydimethylsiloxane copolymerized Polycarbonate (PDMS-PC) compared with Polycarbonate (PC). Depending on the test temperature and tensi
Externí odkaz:
https://doaj.org/article/8e99509c19cb43d4930673fd69bac9c6
Publikováno v:
Journal of the Japan Society for Precision Engineering. 88:435-439
Publikováno v:
Clinical and Molecular Hepatology, Vol 30, Iss 4, Pp 959-961 (2024)
Externí odkaz:
https://doaj.org/article/d4fe47c4945444ecb939ea3263b235db
Publikováno v:
Precision Engineering. 67:350-358
A quantitative analysis of the surface and subsurface damage to gallium nitride (GaN) substrate from precise mechanical polishing with diamond abrasives and characterizations of their removal by the chemical mechanical polishing (CMP) process with co
Autor:
Hideo Aida, Takumi Ojima, Ryuji Oshima, Takahiro Ihara, Hidetoshi Takeda, Yutaka Kimura, Atsuhito Sawabe
Publikováno v:
ECS Journal of Solid State Science and Technology. 11:114005
Single-crystalline MgO is used as a substrate for the deposition of various functional thin films. The present study focused on the development of a complete sequence of fabricating atomic step-terrace structures on the MgO substrate via a method tha
Autor:
Yukari Ishikawa, Yoshihiro Sugawara, Yongzhao Yao, Hidetoshi Takeda, Hideo Aida, Kazuyuki Tadatomo
Publikováno v:
Journal of Physics D: Applied Physics. 55:485304
With the aim of developing a method of estimating the thickness of an affected layer on a wide-bandgap semiconductor wafer caused by scratching, we investigated the dependence of dislocation pattern size on the width of the imprint (or scratch) induc
Autor:
Yukari Ishikawa, Yoshihiro Sugawara, Yongzhao Yao, Hidetoshi Takeda, Hideo Aida, Kazuyuki Tadatomo
Publikováno v:
Journal of Applied Physics. 131:225303
3D dislocation structures induced by Vickers indentation depending on the imprint size are precisely investigated using an alternation of cathodoluminescence and chemical mechanical polishing (CMP), multiphoton excitation photoluminescence, and (scan
Publikováno v:
ECS Journal of Solid State Science and Technology. 10:106007
Autor:
Hiroshi Makino, Toshihiro Yamamoto, Takashi Hiyoshi, Hidetoshi Takeda, Toshihumi Simazaki, Wataru Oyama
Publikováno v:
Journal of the Society of Materials Science, Japan. 65:293-299