Zobrazeno 1 - 10
of 124
pro vyhledávání: '"Hidehiko NONAKA"'
Autor:
Yohei KOBAYASHI, Akira KUROKAWA, Takichi KOBAYASHI, Hisao HOJO, Hidehiko NONAKA, Shingo ICHIMURA, Masaru HIRATA
Publikováno v:
Journal of Thermal Science and Technology, Vol 2, Iss 1, Pp 102-110 (2007)
Quartz is used in various devices, since it can be easily vibrated by the piezoelectric effect and controlled in an electric circuit. The force, which acts on the vibrating body, follows the principles of fluid dynamics; this phenomenon is explained
Externí odkaz:
https://doaj.org/article/f404ef205c854972b9807e574a1a1274
Autor:
Miura Toshinori, Kameda Naoto, Yoshiki Morikawa, Hidehiko Nonaka, Mitsuru Kekura, Ken Nakamura
Publikováno v:
Vacuum and Surface Science. 62:433-438
Autor:
K. J. Kim, Mario Barozzi, D. E. Sykes, Yoshikazu Homma, S. Hayashi, Mitsuhiro Tomita, Charles W. Magee, Hidehiko Nonaka, Joe Bennett, Akio Takano, Atsushi Murase, David S. Simons
Publikováno v:
Surface and Interface Analysis. 47:681-700
A Versailles Project on Advanced Materials and Standards round robin test (RRT) has been conducted to evaluate the linearity of the instrumental intensity scale and correction method using an approximation intermediate extended dead time model with p
Autor:
Akio Takano, Mitsuhiro Tomita, Charles W. Magee, K. J. Kim, Joe Bennett, Mario Barozzi, D. E. Sykes, Hidehiko Nonaka, Atsushi Murase, David S. Simons, S. Hayashi, Yoshikazu Homma
Publikováno v:
Surface and Interface Analysis. 46:244-248
Recently, dynamic SIMS (D-SIMS) is being used to analyze ions simultaneously over a wide range of concentrations, from matrix level to extremely low (ng g−1). However, D-SIMS detectors, which are mostly used in pulse counting systems, have problems
Publikováno v:
Chemical Physics Letters. 556:44-48
The kinetic energies of Ir m (CO) n + ions observed in the high resolution TOF-SIMS of Ir 4 (CO) 12 layer have been estimated using the post-acceleration electrode method. The observed kinetic energy of secondary ion depends on the number of coordina
Publikováno v:
Surface and Interface Analysis. 45:517-521
Publikováno v:
Surface and Interface Analysis. 44:1287-1293
Recently, secondary ion mass spectrometry (SIMS) has been used in the analysis of not only impurities but also matrix elements, thus requiring a wide dynamic range for SIMS analysis. However, SIMS detectors, which are mostly used in pulse counting sy
Publikováno v:
International Journal of Mass Spectrometry. 311:24-30
The apparent mass shift of the CsI cluster ions (CsI)nCs+ and (CsI)nI− observed in high resolution mass spectra by TOF-SIMS of CsI crystal has been investigated in terms of the kinetic energy of the ions. The sharp peak of CsI cluster ion showed ap
Publikováno v:
Chemical Physics Letters. 501:335-339
To develop a cluster ion beam source for secondary ion mass spectrometry (SIMS), beam characteristics of charged droplets electrosprayed in a vacuum were investigated using a room-temperature molten salt (i.e., an ionic liquid). A target current exce
Autor:
Hidehiko Nonaka, Atsushi Suzuki
Publikováno v:
Vacuum. 84:1389-1392
The dissociation ratio of source gas molecules is measured using a quartz sensor, for which the output depends on the average molecular weight and viscosity of gases. The change in the pressure and temperature-normalized quartz sensor output (NQO) by