Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Hickey, Jim"'
Publikováno v:
In Applied Acoustics 1 March 2025 231
Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is conventional
Externí odkaz:
http://arxiv.org/abs/1804.02602
Autor:
Hickey, Jim, Counte, Joseph, Lee, Jaebin, Araguás Rodríguez, Silvia, Rai, Kieron, Lee, Kidon, Mun, Younggi, Karagiannopoulos, Solon, Hong, Giwon, Feist, Jörg P.
Publikováno v:
Journal of Turbomachinery; May 2025, Vol. 147 Issue: 5 p051003-051003, 1p
Autor:
HICKEY, JIM, ARAYA, ALICIA
Publikováno v:
Social Policy; Fall2014, Vol. 44 Issue 3, p35-46, 12p
Autor:
Karagiannopoulos, Solon1 solon.k@sensorcoatings.com, Taniguchi Tomoki2 taniguchi_tomoki@khi.co.jp, Peral, David1 peral@hotmail.com, Rodríguez, Silvia Araguás1 s.araguas@sensorcoatings.com, Ryozo Tanaka2 tanaka_r@khi.co.jp, Hickey, Jim1 j.hickey@sensorcoatings.com, Feist, Jörg P.1 j.feist@sensorcoatings.com
Publikováno v:
Journal of Engineering for Gas Turbines & Power. Nov2024, Vol. 146 Issue 11, p1-10. 10p.
Autor:
Hickey, Jim, Goure, Daniel
Publikováno v:
Rotor & Wing International; Jul/Aug2017, Vol. 51 Issue 6, p6-6, 2/3p
Publikováno v:
Power & Motoryacht; May2017, Vol. 33 Issue 5, p12-12, 1p
Autor:
Hickey, Jim
Publikováno v:
Database Trends & Applications; Dec2007, Vol. 21 Issue 12, p9-15, 2p
Autor:
Hickey, Jim
Publikováno v:
Parachutist; Feb2008, Vol. 49 Issue 2, p15-15, 1p, 3 Color Photographs