NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.

Autor: Alpaslan, E., Kruseman, B., Majhi, A. K., Heuvalman, W. M., Dworak, J.

Publikováno v: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; May2012, Vol. 31 Issue 5, p809-813, 5p