Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Hernan Aparicio"'
Publikováno v:
Integration. 82:127-135
Power supply noise in current nanometer technologies represents a growing risk, specially because of the uncertainties it produces in the critical paths delays which can result in erroneous computations. Also, these very short variations can affect t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27d5072767c7a3a196691c571ce627a8
https://doi.org/10.1016/j.vlsi.2021.09.004
https://doi.org/10.1016/j.vlsi.2021.09.004
Autor:
Carlos A. López-Barrio, Hernan Aparicio, Pablo Royer, Fernando Garcia-Redondo, Marisa Lopez-Vallejo, Pablo Ituero
Publikováno v:
IEEE Transactions on very large scale integration (VLSI) Systems, ISSN 1557-9999, 2016-12-19, Vol. 25, No. 4
Archivo Digital UPM
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Archivo Digital UPM
instname
Resistive switching memories [resistive RAM (RRAM)] are an attractive alternative to nonvolatile storage and nonconventional computing systems, but their behavior strongly depends on the cell features, driver circuit, and working conditions. In parti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::27cbf6ba7ab21ef2849023b0806940bc
https://doi.org/10.1109/tvlsi.2016.2634083
https://doi.org/10.1109/tvlsi.2016.2634083
Autor:
Hernan Aparicio, Pablo Ituero
Publikováno v:
Sensors, Vol 20, Iss 3725, p 3725 (2020)
The extreme miniaturization of electronic technologies has turned varying and unpredictable temperatures into a first-class concern for high performance processors which mitigate the problem employing dynamic thermal managements control systems. In o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a9037b4912b192c4162380c08677541
https://doi.org/10.3390/s20133725
https://doi.org/10.3390/s20133725
Autor:
Pablo Ituero, Hernan Aparicio
Publikováno v:
28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS) | 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS) | 02/07/2018-04/07/2018 | Platja d'Aro, Spain
Archivo Digital UPM
instname
PATMOS
Archivo Digital UPM
instname
PATMOS
In the current context of strict low-power requirements, complex dynamic frequency and voltage scale systems try to constantly push the operating conditions of electronic chips to the lower bound that fulfills the performance requirements. Also, at t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b28077052848aae91e515d6597fcef54
http://oa.upm.es/67241/
http://oa.upm.es/67241/
Autor:
Hernan Aparicio, Fernando Garcia-Redondo, Marisa Lopez-Vallejo, Pablo Ituero, Carlos A. López-Barrio
Publikováno v:
2016 Conference on Design of Circuits and Integrated Systems (DCIS).
Nowadays the uncertainties produced by the combined effect of PVT Variations together with radiation dramatically compromises electronic systems behavior. Usually, radiation effects are studied from a digital point of view, analyzing upset error rati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90342bc635ec0a7952a7c60da7e915d5
https://doi.org/10.1109/dcis.2016.7845361
https://doi.org/10.1109/dcis.2016.7845361
Publikováno v:
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW).
Nanometer technologies are exposed to several sources of variability, among these, Power Supply Noise (PSN) has become a mayor challenge. This paper provides a broad perspective of the causes and effects of PSN along with the evolution of techniques
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::839ad9cd13d83d7690d3693e9e0f0655
https://doi.org/10.1109/ims3tw.2016.7524237
https://doi.org/10.1109/ims3tw.2016.7524237
Publikováno v:
2016 12th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME).
The presence of noise in the power supply line in the form of ripples or spikes jeopardizes the behavior of electronic circuits. One solution to this problem is the use of power supply monitors that flag a signal whenever a hazardous situation is det
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57e142140643b4f45c7c70c4177acabd
https://doi.org/10.1109/prime.2016.7519495
https://doi.org/10.1109/prime.2016.7519495
Publikováno v:
SMACD
The effects caused by variability, temperature, radiation or aging may compromise the reliability of electronic circuits. Circuits designers must consider their combined effects early during the design cycle, even though it is a time and effort deman
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d762728fab9d5a012da67c5f87429727
https://doi.org/10.1109/smacd.2016.7520646
https://doi.org/10.1109/smacd.2016.7520646
Publikováno v:
2015 International Workshop on CMOS Variability (VARI).
Power supply noise in current nanometer technologies represents a growing risk, specially because of the uncertainties it produces in the critical paths delays which can result in erroneous computations. To tackle with these issues and to have a bett
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efef1ff03fd4f238c20efcac95000759
https://doi.org/10.1109/vari.2015.7456555
https://doi.org/10.1109/vari.2015.7456555
Publikováno v:
Design of Circuits and Integrated Systems.
The benefits of technology scaling have been accompanied by undesirable variations of a large number of parameters that need to be offset to ensure the proper operation of current electronic systems. Timing uncertainties are one of the most dangerous
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83b70b6a3c4907063dd39bacfe52f718
https://doi.org/10.1109/dcis.2014.7035593
https://doi.org/10.1109/dcis.2014.7035593