Interpretation of the bulk etching process in LR-115 detectors by the many-hit model

Autor: Ditlov, V.A. ^{a, ⁎}, Awad, E.M. ^b, Hermsdorf, D. ^c, Fromm, M. ^d

Publikováno v: In Radiation Measurements 2008 43 Supplement 1:S82-S86

Physics aspects of light particle registration in PADC detectors of type CR-39

Autor: Hermsdorf, D. ^∗

Publikováno v: In Radiation Measurements 2011 46(4):396-404

Description of the bulk etching rate of CR-39 by an extended Arrhenius-like law in increased intervalls of temperature and etchant concentration

Autor: Awad, E.M. ^{a, 1}, Ditlov, V.A. ^b, Fromm, M. ^c, Hermsdorf, D. ^{d, ∗}

Publikováno v: In Radiation Measurements 2009 44(9):813-820

Determination of track etch rates from wall profiles of particle tracks etched in direct and reversed direction in PADC CR-39 SSNTDs

Autor: Hermsdorf, D. ^∗, Hunger, M.

Publikováno v: In Radiation Measurements 2009 44(9):766-774

Real-Time Crystal Growth Monitoring of Boric Acid from Sodium or Lithium Sulfate Containing Aqueous Solutions by Atomic Force Microscopy.

Autor: Alavia W; Faculty of Engineering, Universidad Alberto Hurtado, Almirante Barroso 10, 8340575 Santiago, Chile.; Max Planck Institute for Dynamics of Complex Technical Systems Magdeburg, Sandtorstraße 1, D-39106 Magdeburg, Germany., Seidel-Morgenstern A; Max Planck Institute for Dynamics of Complex Technical Systems Magdeburg, Sandtorstraße 1, D-39106 Magdeburg, Germany.; Institute for Process Engineering, Otto von Guericke University Magdeburg, Universitätsplatz 2, D-39106 Magdeburg, Germany., Hermsdorf D; Max Planck Institute for Dynamics of Complex Technical Systems Magdeburg, Sandtorstraße 1, D-39106 Magdeburg, Germany., Lorenz H; Max Planck Institute for Dynamics of Complex Technical Systems Magdeburg, Sandtorstraße 1, D-39106 Magdeburg, Germany., Graber TA; Departamento de Ingeniería Química y Procesos de Minerales, Universidad de Antofagasta, 1270300 Antofagasta, Chile.

Publikováno v: ACS omega [ACS Omega] 2023 Mar 20; Vol. 8 (12), pp. 10822-10835. Date of Electronic Publication: 2023 Mar 20 (Print Publication: 2023).