Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Hermanus Leonardus Peek"'
Autor:
M.A.R.C. de Wolf, J.T. Bosiers, H.O. Folkerts, Hermanus Leonardus Peek, Bart Dillen, A.C. Kleimann, W. Klaassens, Albert J. P. Theuwissen, Cees Draijer, F.J. Polderdijk
Publikováno v:
IEEE Transactions on Electron Devices. 50:254-265
To meet the demand for higher resolution in professional digital imaging, an 11 M pixel, 35-mm format full-frame CCD image sensor was developed as an upgrade for an existing 6 M pixel CCD. This paper presents the device requirements, the architecture
Autor:
J.P. Maas, J.T. Bosiers, L. Le Cam, Hermanus Leonardus Peek, H. van Kuijk, Albert J. P. Theuwissen, A.C. Kleimann
Publikováno v:
IEEE Transactions on Electron Devices. 49:377-386
Digital still cameras are becoming a widely used alternative for conventional silver-halide cameras. This paper presents first the concept of frame-transfer CCD imagers designed for consumer digital cameras. Next, the different modes of operation are
Publikováno v:
IEEE Transactions on Electron Devices. 42:1449-1460
A Frame-Transfer CCD imager for consumer applications has been developed with low dark current by using hole accumulation at the entire Si-SiO/sub 2/ interface of the image pixel during integration, called "All-Gates Pinning", or AGP. All sensor feat
Autor:
Noortje J. Daemen, A.L. Kokshoorn, Jan T. Bosiers, Hermanus Leonardus Peek, Bartholomeus Goverdina Maria Henricus Dillen, L.T. van Gaal, A.C. Kleimann, A.G. van der Sijde
Publikováno v:
IEEE Transactions on Electron Devices. 38:1059-1068
The authors present a high-resolution frame-transfer charge-coupled-device (CCD) suitable for S-VHS camcorders with an additional full-resolution true electronic still picture (ESP) mode of operation. The CCD sensor is composed of an image section, a
Autor:
R.H.S. de Gruyter, P.G.M. Centen, Hermanus Leonardus Peek, P.B. Hartog, Albert J. P. Theuwissen, A.C. Kleimann, A. Mierop, D.W. Verbugt, Holger Stoldt, F.F. Vledder
Publikováno v:
International Electron Devices Meeting. Technical Digest.
A 2/3" FrameTransfer-CCD imager with 600k pixels for the NTSC standard is reported. Layout of the light sensitive part is based on a single-gate repetition structure. By this the image format is switchable in the vertical direction between standard (
Publikováno v:
International Electron Devices Meeting. Technical Digest.
A 300 k-pixel frame-transfer image sensor ( 1/8 " optical format), with a pixel size of 2.4/spl times/2.4 /spl mu/m/sup 2/, the smallest ever published, is reported. This sensor follows the "VGA" standard (640/spl times/480 progressive scan, 60 fr./s
Autor:
Hermanus Leonardus Peek, Edwin Roks, J.M. Van der Beyden, Jan T. Bosiers, Yvonne Astrid Boersma
Publikováno v:
Proceedings of 1994 IEEE International Electron Devices Meeting.
A VGA-compatible 1/4" true progressive scan 640(H)/spl times/480(V) FT-CCD imager with 5.1/spl times/5.1 /spl mu/m/sup 2/ pixels designed for compact, low-power multimedia applications, is presented. To obtain high charge storage in this very small p
Autor:
Hermanus Leonardus Peek, Y.A. Beorsma, D.W. Verbugt, J.T. Bosiers, A.C. Kleimann, A.G. van der Sijde
Publikováno v:
International Electron Devices Meeting. IEDM Technical Digest.
A 1/3” progressive scan QGA-format 1280(H) x 960(V) FT-CCD imager with 3.7x3.7 pm2 pixels designed for digital still camera applications is presented. A reduced storage section in combination with subsampling allows the generation of a color NTSC c
Autor:
A.C. Kleimann, Bart G. M. Dillen, Hermanus Leonardus Peek, R. Pellens, J. Oppers, Willem Hoekstra, Albert J. P. Theuwissen, Gregory Kreider, P. Opmeer, Jan T. Bosiers, J.W.J.M. van der Heijden
Publikováno v:
Proceedings of International Electron Devices Meeting.
A 1 K/spl times/2 K full frame sensor demonstrates a new modular sensor design. Each imager in the family is built from smaller, abutable blocks which are exposed in the correct position during lithography. These blocks can be stacked to form sensors
Autor:
H. van Kuijk, Hermanus Leonardus Peek, C.R. Peschel, L. Le Cam, J.T. Bosiers, J.P. Maas, A.C. Kleimann
Publikováno v:
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
Sensitivity improvements in a 3.2 M-pixel CCD image sensor developed for digital still camera applications are presented. The introduction of gap-less microlenses increases the sensitivity with 25-30% while the high angular response is maintained. Wi