Zobrazeno 1 - 10
of 60
pro vyhledávání: '"Herman, Al"'
Publikováno v:
ICTACT Journal on Microelectronics, Vol 1, Iss 3, Pp 96-100 (2020)
Low Noise Amplifier is considered as one of the most important component at the receiver end. The basic characteristics and features that a device should possess in the field of Wireless Sensor Network is high gain with low power consumption and size
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::32d6a65f10161582f4f727e20b96a207
http://ictactjournals.in/paper/IJME_paper_2_096_100.pdf
http://ictactjournals.in/paper/IJME_paper_2_096_100.pdf
Autor:
Daniluk, Judith C., Herman, Al
Publikováno v:
Family Relations, 1984 Oct 01. 33(4), 607-612.
Externí odkaz:
https://www.jstor.org/stable/583842
Autor:
Woodcock, Penny Robinson, Herman, Al
Publikováno v:
The School Counselor, 1978 Mar 01. 25(4), 256-264.
Externí odkaz:
https://www.jstor.org/stable/23899843
Publikováno v:
Algorithms for Intelligent Systems ISBN: 9789811552427
This paper discusses a sophisticated control for nonlinear system in such a way that the state trajectories remain in predefined manifold and converges asymptotically. One of the solutions to the problem is by the use of generalized super-twisting co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48bfad2808a02cc9b7efbed18b5e0120
https://doi.org/10.1007/978-981-15-5243-4_78
https://doi.org/10.1007/978-981-15-5243-4_78
The GaN devices have significant advantages in terms of power density, characteristics and voltage range based on conventional compound semiconductors or Silicon. The aim of this work is to observe and analyze the results of 3D Structural Reliability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0d7bd8ed852a7358afb84e0b0ae235e8
Autor:
Regehr, Carol N., Herman, Al
Publikováno v:
The School Counselor, 1981 May 01. 28(5), 335-342.
Externí odkaz:
https://www.jstor.org/stable/23903320
Publikováno v:
2016 International Conference on Electrical, Electronics, and Optimization Techniques (ICEEOT).
Performance and reliability analysis tests the VLSI circuits over a prolonged period of time at different conditions. Therefore, performance and reliability of an inverter circuit and two CMOS gate interconnect circuit, a combination of two inverters
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3098a07b0b7a7ea3f348634c706865c
https://doi.org/10.1109/iceeot.2016.7755590
https://doi.org/10.1109/iceeot.2016.7755590
Autor:
Daniluk, Judith C., Herman, Al
Publikováno v:
Personnel & Guidance Journal. Dec83, Vol. 62 Issue 4, p240. 4p.
Publikováno v:
2016 International Conference on Electrical, Electronics & Optimization Techniques (ICEEOT); 2016, p4612-4616, 5p
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