Zobrazeno 1 - 10
of 138
pro vyhledávání: '"Herbert Wormeester"'
Autor:
Rajesh Munirathinam, Roberto Ricciardi, Richard J. M. Egberink, Jurriaan Huskens, Michael Holtkamp, Herbert Wormeester, Uwe Karst, Willem Verboom
Publikováno v:
Beilstein Journal of Organic Chemistry, Vol 9, Iss 1, Pp 1698-1704 (2013)
Polystyrene sulfonate polymer brushes, grown on the interior of the microchannels in a microreactor, have been used for the anchoring of gallium as a Lewis acid catalyst. Initially, gallium-containing polymer brushes were grown on a flat silicon oxid
Externí odkaz:
https://doaj.org/article/d3df32f8fdb7438299a644706d569796
Autor:
Juequan Chen, Eric Louis, Rob Harmsen, Tim Tsarfati, Herbert Wormeester, Maarten van Kampen, Willem van Schaik, Robbert van de Kruijs, Fred Bijkerk
Publikováno v:
Applied Surface Science. 618:155765
Autor:
Michiel J.T. Raaijmakers, Emiel J. Kappert, Kristianne Tempelman, Herbert Wormeester, Nieck E. Benes
Publikováno v:
Surface and Interface Analysis. 49:538-547
The accuracy of spectroscopic ellipsometry studies of transparent polymer films in the visible wavelength range is greatly reduced in the presence of a liquid ambient. The relatively high refractive index of a liquid ambient strongly amplifies the ef
Autor:
Harold J.W. Zandvliet, Gregor Hlawacek, Herbert Wormeester, Raoul van Gastel, Maciej Jankowski, Bene Poelsema
Publikováno v:
Ultramicroscopy, 162, 17-24. Elsevier
Ultramicroscopy 162(2016), 17-24
Ultramicroscopy 162(2016), 17-24
Helium Ion Microscopy is known for its surface sensitivity and high lateral resolution. Here, we present results of a Helium Ion Microscopy based investigation of a surface confined alloy of Ag on Pt(111). Based on a change of the work function of 25
Publikováno v:
Applied surface science, 353, 1285-1290. Elsevier
We have used atomic force microscopy (AFM) to measure the snap-off forces between a micron sized flat silicon AFM tip and a rough Si(0 0 1) surface. The current paper is a natural continuation of our previous paper (Çolak et al., 2014), dealing with
Autor:
Nieck E. Benes, Matthias Wessling, Herbert Wormeester, Wojciech Ogieglo, Klaus-Jochen Eichhorn
Publikováno v:
Progress in polymer science, 42, 42-78. Elsevier
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological applications, suchas protective and functional coatings, sensors, microelectronics, surfac
Publikováno v:
Polymer, 55(7), 1737-1744. Elsevier
An accurate determination of a penetrant volume fraction in a swollen polymer is of crucial importance in a range of different technologies. Using optical methods, such as in-situ spectroscopic ellipsometry, it is possible to extract the thickness an
Autor:
Arian Nijmeijer, Matthias Wessling, Wojciech Ogieglo, Hans van der Werf, Nieck E. Benes, Kristianne Tempelman, Herbert Wormeester
Publikováno v:
Journal of membrane science, 431, 233-243. Elsevier
A nondestructive technique is presented for in-situ analysis of solvent induced membrane swelling. The technique is based on spectroscopic ellipsometry (SE) and allows simultaneous measurement of membrane film thickness and solvent sorption. The atta
Autor:
Michael Holtkamp, Rajesh Munirathinam, Jurriaan Huskens, Uwe Karst, Herbert Wormeester, Willem Verboom, Richard J.M. Egberink, Roberto Ricciardi
Publikováno v:
Beilstein Journal of Organic Chemistry
Beilstein journal of organic chemistry, 9, 1698-1704. Beilstein-Institut Zur Forderung der Chemischen Wissenschaften
Beilstein Journal of Organic Chemistry, Vol 9, Iss 1, Pp 1698-1704 (2013)
Beilstein journal of organic chemistry, 9, 1698-1704. Beilstein-Institut Zur Forderung der Chemischen Wissenschaften
Beilstein Journal of Organic Chemistry, Vol 9, Iss 1, Pp 1698-1704 (2013)
Polystyrene sulfonate polymer brushes, grown on the interior of the microchannels in a microreactor, have been used for the anchoring of gallium as a Lewis acid catalyst. Initially, gallium-containing polymer brushes were grown on a flat silicon oxid
Publikováno v:
Polymer, 54(1), 341-348. Elsevier
In-situ Spectroscopic Ellipsometry is used to study diffusion of liquid n-hexane in silicon wafer supported 150 nm thick polystyrene films, in the temperature range 16e28 C. In the higher part of this temperature range Case II diffusion is shown to b