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pro vyhledávání: '"Herb Huang"'
Autor:
Herb Huang, Rino Micheloni
Publikováno v:
3D Flash Memories ISBN: 9789401775106
3D Flash Memories
3D Flash Memories
Small form factors have been one of the main drivers for the success of Flash memory cards, largely in the form of USB stick and Secure Digital, SD. On the other hand, mainly driven by the success of Solid State Drives (SSDs), capacity requirement ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::683c318d4804a1780220e29a061702be
https://doi.org/10.1007/978-94-017-7512-0_9
https://doi.org/10.1007/978-94-017-7512-0_9
Publikováno v:
SCIENTIA SINICA Informationis. 42:1509-1528
The technology development of micro-nano electronics in global IC industry is summarized and reviewed in the present paper. There are many challenges and opportunities as the innovative devices and materials have gradually been applied to IC manufact
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::932dfc384b842985921169562afb605f
https://doi.org/10.1360/112012-506
https://doi.org/10.1360/112012-506
Autor:
Herb Huang
Publikováno v:
Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).
As key front-end, middle-end and backend module process enablers are approaching or achieve maturity, TSV technology has been successfully implemented onto certain advanced commercial IC products. Intensive effort is being made currently to explore f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::66933be8477f8885ec8c7e7349bbd1fe
https://doi.org/10.1109/vlsi-tsa.2014.6839702
https://doi.org/10.1109/vlsi-tsa.2014.6839702
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 14:1901-1906
Plasma etching is often considered a yield limiter in the manufacturing of submicron integrated circuit devices. Much effort has been devoted to developing reliable models that relate the process outputs to variations in real‐time sensor signals. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80b2bc08ab11afa0bd4902409af29c9d
https://doi.org/10.1116/1.580357
https://doi.org/10.1116/1.580357