GaAs submicron ring oscillators characterized by electron-beam testing.

Autor: Grave, T., Schmitt, R., Winkler, D., Anger, K., Heopfner, J., Siweris, H.-J., Muller, J.-E., Kellner, W.

Publikováno v: 10th Annual IEEE (GaAs IC) Symposium, Gallium Arsenide Integrated Circuit Technical Digest 1988; 1988, p209-212, 4p