Zobrazeno 1 - 10
of 1 094
pro vyhledávání: '"Hentschel M"'
Autor:
Martin, V., Brito, J. P., Ortiz, L., Mendez, R. B., Buruaga, J. S., Vicente, R. J., Sebastián-Lombraña, A., Rincon, D., Perez, F., Sanchez, C., Peev, M., Brunner, H. H., Fung, F., Poppe, A., Fröwis, F., Shields, A. J., Woodward, R. I., Griesser, H., Roehrich, S., De La Iglesia, F., Abellan, C., Hentschel, M., Rivas-Moscoso, J. M., Pastor, A., Folgueira, J., Lopez, D. R.
Current quantum key distribution (QKD) networks focus almost exclusively on transporting secret keys with the highest possible rate. Consequently, they are built as mostly fixed, ad hoc, logically, and physically isolated infrastructures designed to
Externí odkaz:
http://arxiv.org/abs/2311.12791
Autor:
Schaab, J., Shapovalov, K., Schoenherr, P., Hackl, J., Khan, M. I., Hentschel, M., Yan, Z., Bourret, E., Schneider, C. M., Nemsák, S., Stengel, M., Cano, A., Meier, D.
Publikováno v:
Appl. Phys. Lett. 115, 122903 (2019)
Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining X-PEEM with scanning probe microscopy and theory, we develop a model t
Externí odkaz:
http://arxiv.org/abs/2001.04894
Akademický článek
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Autor:
Schaab, J., Krug, I. P., Nickel, F., Gottlob, D. M., Doğanay, H., Cano, A., Hentschel, M., Yan, Z., Bourret, E., Schneider, C. M., Ramesh, R., Meier, D.
Publikováno v:
Appl. Phys. Lett. 104, 232904 (2014)
High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating
Externí odkaz:
http://arxiv.org/abs/1405.2053
Publikováno v:
Optics Express, Vol. 17, Issue 25, pp. 23153-23159 (2009)
We demonstrate a compact and stable source of polarization-entangled pairs of photons, one at 810 nm wavelength for high detection efficiency and the other at 1550 nm for long-distance fiber communication networks. Due to a novel Sagnac-based design
Externí odkaz:
http://arxiv.org/abs/1007.3119
Publikováno v:
Phys. Rev. B 76, 245419 (2007)
We study Fermi edge singularities in photo-absorption spectra of generic mesoscopic systems such as quantum dots or nanoparticles. We predict deviations from macroscopic-metallic behavior and propose experimental setups for the observation of these e
Externí odkaz:
http://arxiv.org/abs/0706.2612
Autor:
Hentschel, M., Nockel, J. U.
Publikováno v:
Quantum Optics of Small Structures, edited by D.Lenstra, T.D.Visser and K.A.H.van Leeuwen (Edita KNAW, Amsterdam, 2000)
The stationary states of a microlaser are related to the decaying quasibound states of the corresponding passive cavity. These are interpreted classically as originating from sequential escape attempts of an ensemble of rays obeying a curvature-corre
Externí odkaz:
http://arxiv.org/abs/physics/0203064
Autor:
Hentschel, M., Schomerus, H.
Publikováno v:
Phys. Rev. E 65, 045603(R) (2002)
We discuss curvature corrections to Fresnel's laws for the reflection and transmission of light at a non-planar refractive-index boundary. The reflection coefficients are obtained from the resonances of a dielectric disk within a sequential-reflectio
Externí odkaz:
http://arxiv.org/abs/physics/0111160
Autor:
Kienberger, R., Hentschel, M., Uiberacker, M., Kitzler, M., Scrinzi, A., Wieland, M., Kleineberg, U., Heinzmann, U., Drescher, M., Krausz, F.
Publikováno v:
Science, 2002 Aug . 297(5584), 1144-1148.
Externí odkaz:
https://www.jstor.org/stable/3832212
Publikováno v:
In Procedia Manufacturing 2016 6:132-139