Výsledky vyhledávání - "Henry Lee Aldridge"

High Performance SiGe HBT Performance Variability Learning by Utilizing Neural Networks and Technology Computer Aided Design

Autor: Jeffrey B. Johnson, Dongmo Pernell, Uppili S. Raghunathan, Rajendran Krishnasamy, Henry Lee Aldridge, John J. Pekarik, Vibhor Jain, Mishra Rahul

Publikováno v: ECS Transactions. 98:127-134

Process sensitivity and variation, such as layer thicknesses, etch dimensions and doping levels are all process parameters that should be well understood when assessing their impact on end of process wafer quality and device performance. Improvements

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::23961cb163669d249dec381d3652ad3b
https://doi.org/10.1149/09805.0127ecst

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