Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Henrik Arlinghaus"'
Autor:
Felix Kollmer, Alexander Pirkl, Henrik Arlinghaus, Rudolf Möllers, Nathan Havercroft, Ewald Niehuis
Publikováno v:
Microscopy and Microanalysis. 28:942-943
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2453d1378ab38b96572c9f49d8dd492c
https://doi.org/10.1017/s1431927622004123
https://doi.org/10.1017/s1431927622004123
Autor:
Vincent S. Smentkowski, Henrik Arlinghaus, Julia Zakel, Richard Hart, Hongbo Cao, Felix Kollmer
Publikováno v:
Microscopy and Microanalysis. 26:2686-2688
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::890066a3bee18589caf584f18ae28084
https://doi.org/10.1017/s1431927620022424
https://doi.org/10.1017/s1431927620022424
Autor:
Ian S. Gilmore, Peter S. Marshall, Melissa K. Passarelli, Alexander Makarov, Morgan R. Alexander, Dmitry Grinfeld, Stevan Horning, Rudolf Moellers, Colin T. Dollery, Andrew West, Rasmus Havelund, Ewald Niehuis, Carla F. Newman, Alexander Pirkl, Felix Kollmer, Henrik Arlinghaus
Publikováno v:
Nature Methods. 14:1175-1183
© 2017 Nature America, Inc., part of Springer Nature. All rights reserved. We report the development of a 3D OrbiSIMS instrument for label-free biomedical imaging. It combines the high spatial resolution of secondary ion mass spectrometry (SIMS; und
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8678987b5c985672e48ae22c20695052
https://doi.org/10.1038/nmeth.4504
https://doi.org/10.1038/nmeth.4504
Autor:
Felix Kollmer, Henrik Arlinghaus, Ewald Niehuis, Sven Kayser, Alexander Pirkl, Nathan Havercroft, Rudolf Moellers
Publikováno v:
Microscopy and Microanalysis. 26:76-77
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a46f05bd02288050b6ec3077d09cae5
https://doi.org/10.1017/s143192762001329x
https://doi.org/10.1017/s143192762001329x
Publikováno v:
Surface Science. 652:39-45
Time of flight secondary ion mass spectrometry (ToF-SIMS) is frequently used to analyze industrial samples since it offers high (ppb) detection sensitivity, very high surface specificity (analysis of the top 1–3 surface layers during a spectral/ima
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28c7367d295fff19ef2ef892540ce165
https://doi.org/10.1016/j.susc.2016.02.017
https://doi.org/10.1016/j.susc.2016.02.017
Autor:
Raphaelle Dianoux, Ewald Niehuis, Adi Scheidemann, Henrik Arlinghaus, Sasa Vranjkovic, Rudolf Möllers, Hans-Josef Hug, Felix Kollmer, Laetitia Bernard
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5fe7e536d37bec0db7f587897bc33872
http://doc.rero.ch/record/290080/files/S143192761500793X.pdf
http://doc.rero.ch/record/290080/files/S143192761500793X.pdf
Autor:
Anja Henss, Ewald Niehuis, Wolfgang Paul, Nathan Havercroft, Felix Kollmer, Rudolf Moellers, Henrik Arlinghaus
Publikováno v:
Microscopy and Microanalysis. 24:1026-1027
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a38ac7ea82e5f9b680d60adf4f7cd056
https://doi.org/10.1017/s1431927618005627
https://doi.org/10.1017/s1431927618005627
Autor:
Morgan R. Alexander, Ewald Niehuis, Ian S. Gilmore, Rudolf Moellers, Rasmus Havelund, Alan M. Race, Alexander G. Shard, Stevan Horning, Colin T. Dollery, Melissa K. Passarelli, Alexander Makarov, Felix Kollmer, Carla F. Newman, Alexander Pirkl, Peter S. Marshall, Paulina D. Rakowska, Henrik Arlinghaus, Andrew West
Publikováno v:
Microscopy and Microanalysis. 22:340-341
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8231e5acf550612a7e0fb57df6d9c01
https://doi.org/10.1017/s1431927616002555
https://doi.org/10.1017/s1431927616002555
Autor:
Hans J. Hug, Sasa Vranjkovic, Henrik Arlinghaus, Felix Kollmer, Rudolf Moellers, Adi Scheidemann, Ewald Niehuis, Laetita Bernard, Raphaelle Dianoux
Publikováno v:
Microscopy and Microanalysis. 20:2086-2087
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b20b1a3000c453665308f5eeebfb5b62
https://doi.org/10.1017/s1431927614012161
https://doi.org/10.1017/s1431927614012161
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 33:05E123
Multivariate statistical analysis, in general, and multivariate curve resolution (MCR), in particular, have found an important role in extracting chemical information from the very large datasets typical of time-of-flight secondary ion mass spectrome
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14b5eee199f54065174a95c5638bebe3
https://doi.org/10.1116/1.4927528
https://doi.org/10.1116/1.4927528