Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Henri Vahlman"'
Autor:
Johannes Greulich, Elmar Lohmüller, Stefan Rein, Pierre Saint-Cast, Sabrina Lohmüller, Karin Hergert, Henri Vahlman, Daniel Ourinson, Stephan Maus, Stefan W. Glunz, Stephan Riepe, Felix Maischner
Publikováno v:
Progress in Photovoltaics: Research and Applications. 30:123-131
We study the mitigation of light- and elevated temperature-induced degradation (LeTID) with high-intensity illumination treatments, placing special emphasis on inline feasibility. After the treatments, we investigate the stability upon degradation co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b184a6fd0d8f70765a3439efaa70808c
https://publica.fraunhofer.de/handle/publica/268217
https://publica.fraunhofer.de/handle/publica/268217
Autor:
Alessandro Inglese, Hele Savin, Henri Vahlman, Marko Yli-Koski, Jonas Schön, Antti Haarahiltunen, Chiara Modanese, Wolfram Kwapil
Publikováno v:
Energy Procedia. 124:188-196
Copper is a common impurity in photovoltaic silicon. While reported to precipitate instantly in n-type Si, copper causes light-induced degradation (Cu-LID) in p-type Si. Recently, partial recovery of Cu-LID was observed after only few minutes of dark
Autor:
Chiara Modanese, Marko Yli-Koski, Alessandro Inglese, Hele Savin, Mt. Wagner, Henri Vahlman, Franziska Wolny, Hannu S. Laine, Alexander Oehlke
openaire: EC/FP7/307315/EU//SOLARX Both multicrystalline and Czochralski (Cz) silicon substrates are known to suffer from various mechanisms of light-induced degradation (LID), including copper-related LID (Cu-LID). Past studies on Cu-LID have mostly
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::27023eec2d1b2f5945c9e65c010c08d3
https://aaltodoc.aalto.fi/handle/123456789/33526
https://aaltodoc.aalto.fi/handle/123456789/33526
Autor:
Matthias Wagner, Franziska Wolny, Hannu S. Laine, Tonio Buonassisi, Henri Vahlman, Antti Haarahiltunen, Mallory A. Jensen, Hele Savin, Chiara Modanese
Publikováno v:
AIP Conference Proceedings.
Autor:
Alessandro Inglese, Jonas Schön, Antti Haarahiltunen, Wolfram Kwapil, Hele Savin, Henri Vahlman
Copper contamination causes minority carrier lifetime degradation in p-type silicon bulk under illumination, leading to considerable efficiency losses in affected solar cells. Although the existence of this phenomenon has been known for almost two de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::53c67e80a5c22ef9a392c1e5f3e98dce
https://aaltodoc.aalto.fi/handle/123456789/26935
https://aaltodoc.aalto.fi/handle/123456789/26935
Publikováno v:
ChemPhysChem. 15:1194-1200
Carbon double bond-free printed solar cells have been fabricated with the structure and , in which CuSCN acts as a hole conductor. The thickness of the CH3NH3PbI3 layer is controlled by a hot air flow during spin coating. The best conversion efficien
Publikováno v:
The Journal of Physical Chemistry C. 117:11920-11929
Volatile electrolytes are a stability concern in dye solar cells (DSCs) due to their tendency for leakage. A composite electrolyte consisting of iodide-based ionic liquid and polyaniline-coated carbon black has been previously reported to provide goo
The presence of copper contamination is known to cause strong light-induced degradation (Cu-LID) in silicon. In this paper, we parametrize the recombination activity of light-activated copper defects in terms of Shockley—Read—Hall recombination s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd9bdee8dabd6952753f428c84491068
https://aaltodoc.aalto.fi/handle/123456789/26985
https://aaltodoc.aalto.fi/handle/123456789/26985
Publikováno v:
Solar Energy. 86:331-338
A simple and non-destructive method is introduced using image processing to investigate changes in the performance of the dye solar cells (DSCs). The main principle is based on the fact that the most important DSC components (dye, electrolyte, cataly