Zobrazeno 1 - 10
of 560
pro vyhledávání: '"Henning Friis"'
Autor:
Axel Henningsson, Mustafacan Kutsal, Jonathan P. Wright, Wolfgang Ludwig, Henning Osholm Sørensen, Stephen A. Hall, Grethe Winther, Henning Friis Poulsen
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-9 (2024)
Abstract Strength, ductility, and failure properties of metals are tailored by plastic deformation routes. Predicting these properties requires modeling of the structural dynamics and stress evolution taking place on several length scales. Progress h
Externí odkaz:
https://doaj.org/article/e3904fbd783947108bfc0a462903b61b
Autor:
Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Sungwook Choi, Matthieu Chollet, Philip K. Cook, Eric Folsom, Eric Galtier, Arnulfo Gonzalez, Tais Gorkhover, Serge Guillet, Kristoffer Haldrup, Marylesa Howard, Kento Katagiri, Seonghan Kim, Sunam Kim, Sungwon Kim, Hyunjung Kim, Erik Bergbäck Knudsen, Stephan Kuschel, Hae Ja Lee, Chuanlong Lin, R. Stewart McWilliams, Bob Nagler, Martin Meedom Nielsen, Norimasa Ozaki, Dayeeta Pal, Ricardo Pablo Pedro, Alison M. Saunders, Frank Schoofs, Toshimori Sekine, Hugh Simons, Tim van Driel, Bihan Wang, Wenge Yang, Can Yildirim, Henning Friis Poulsen, Jon H. Eggert
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-19 (2023)
Abstract The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and de
Externí odkaz:
https://doaj.org/article/960baa5e9f944917a9b734a4e169e0a1
Autor:
Steffen Sloth, Danilo Quagliotti, Leonardo De Chiffre, Morten Christensen, Henning Friis Poulsen
Publikováno v:
e-Journal of Nondestructive Testing, Vol 29, Iss 3 (2024)
Externí odkaz:
https://doaj.org/article/cb04f1bd6d3746c2854a300642d450b4
Autor:
Sloth, Steffen, Willendrup, Peter Kjær, Sørensen, Hans Henrik Brandenborg, Christensen, Morten, Poulsen, Henning Friis
McXtrace is an established Monte Carlo based ray-tracing tool to simulate synchrotron beamlines and X-ray laboratory instruments. This work explains and demonstrates the new capability of GPU-accelerated McXtrace ray-tracing simulations. The openACC
Externí odkaz:
http://arxiv.org/abs/2410.08747
Autor:
Oleksii Ilchenko, Yuriy Pilgun, Andrii Kutsyk, Florian Bachmann, Roman Slipets, Matteo Todeschini, Peter Ouma Okeyo, Henning Friis Poulsen, Anja Boisen
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
Although polarized Raman microscopy is sensitive to orientation changes, quantitative information has been missing. Here, the authors use simultaneous registration of multiple Raman scattering spectra obtained at different polarizations and show quan
Externí odkaz:
https://doaj.org/article/6201c6030489450e950c5bc7ac572a9e
Autor:
Zelenika, Albert, Cretton, Adam André William, Frankus, Felix, Borgi, Sina, Grumsen, Flemming B., Yildirim, Can, Detlefs, Carsten, Winther, Grethe, Poulsen, Henning Friis
During plastic deformation of metals and alloys, dislocations self-organise in cells, which subsequently continuously decrease in size. How and when these processes take place has remained elusive, because observations of the structural dynamics in t
Externí odkaz:
http://arxiv.org/abs/2406.08468
Autor:
Holstad, Theodor S., Dresselhaus-Marais, Leora E., Ræder, Trygve Magnus, Kozioziemski, Bernard, van Driel, Tim, Seaberg, Matthew, Folsom, Eric, Eggert, Jon H., Knudsen, Erik Bergbäck, Nielsen, Martin Meedom, Simons, Hugh, Haldrup, Kristoffer, Poulsen, Henning Friis
Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline
Externí odkaz:
http://arxiv.org/abs/2211.01042
Autor:
Dresselhaus-Marais, Leora E., Kozioziemski, Bernard, Holstad, Theodor S., Ræder, Trygve Magnus, Seaberg, Matthew, Nam, Daewoong, Kim, Sangsoo, Breckling, Sean, Choi, Seonghyuk, Chollet, Matthieu, Cook, Philip K., Folsom, Eric, Galtier, Eric, Gonzalez, Arnulfo, Gorhover, Tais, Guillet, Serge, Haldrup, Kristoffer, Howard, Marylesa, Katagiri, Kento, Kim, Seonghan, Kim, Sunam, Kim, Sungwon, Kim, Hyunjung, Knudsen, Erik Bergback, Kuschel, Stephan, Lee, Hae-Ja, Lin, Chuanlong, McWilliams, R. Stewart, Nagler, Bob, Nielsen, Martin Meedom, Ozaki, Norimasa, Pal, Dayeeta, Pedro, Ricardo Pablo, Saunders, Alison M., Schoofs, Frank, Sekine, Toshimori, Simons, Hugh, van Driel, Tim, Wang, Bihan, Yang, Wenge, Yildirim, Can, Poulsen, Henning Friis, Eggert, Jon H.
Publikováno v:
Scientific Reports, 13, 17573 (2023)
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects req
Externí odkaz:
http://arxiv.org/abs/2210.08366
Autor:
Østergaard, Maja, Naver, Estrid Buhl, Kaestner, Anders, Willendrup, Peter K., Brüel, Annemarie, Sørensen, Henning Osholm, Thomsen, Jesper Skovhus, Schmidt, Søren, Poulsen, Henning Friis, Kuhn, Luise Theil, Birkedal, Henrik
We demonstrate the use of a phase retrieval technique for propagation-based phase contrast neutron imaging with a polychromatic beam. This enables imaging samples with low absorption contrast and/or improving the signal-to-noise ratio to facilitate e
Externí odkaz:
http://arxiv.org/abs/2210.01403
Autor:
Holstad, Theodor Secanell, Raeder, Trygve Magnus, Carlsen, Mads Allerup, Knudsen, Erik Bergback, Dresselhaus-Marais, Leora, Haldrup, Kristoffer, Simons, Hugh, Nielsen, Martin Meedom, Poulsen, Henning Friis
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens i
Externí odkaz:
http://arxiv.org/abs/2111.01545