Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Helmut Mackel"'
Publikováno v:
IEEE Journal of Photovoltaics. 6:1456-1465
For the optimization of alkaline texturing in industrial monocrystalline silicon solar cells, it is of paramount importance to understand the correlation between surface reflectance and surface morphology. In this study, the reflectance is related to
Publikováno v:
Physical Review Applied. 9
Despite great progress in photovoltaic technology, actually measuring how easily current flows in a working thin-film solar cell remains difficult, due to the complex, disordered nature of the absorber material. Understanding how well charge carriers
Autor:
Helmut Mackel, Pietro P. Altermatt
Publikováno v:
IEEE Journal of Photovoltaics. 5:1034-1046
During the firing of screen-printed silver contacts in industrial crystalline silicon solar cells, an interfacial glass layer is formed between the silver bulk contact and the silicon substrate. By means of numerical modeling, we investigate conducti
Publikováno v:
Progress in Photovoltaics: Research and Applications. 23:135-149
A theoretical analysis of the power loss and series resistance of the front side emitter in silicon solar cells is presented. Existing 1D models (infinitely long finger) and 2D models (including the effect of busbars) of emitter series resistance con
Autor:
Helmut Mackel, Andres Cuevas
Publikováno v:
Progress in Photovoltaics: Research and Applications. 14:203-212
A new approach to measure the spectral response of the short-circuit current of solar cells is presented in this investigation. The main innovative feature is the light source, which produces a broad range of intensities, up to 10 suns in a quasi-ste
Autor:
Helmut Mackel, Andres Cuevas
Publikováno v:
Solar Energy Materials and Solar Cells. 81:225-237
This paper explores the possibility of measuring the open-circuit voltage of a solar cell as a function of wavelength as a tool for device characterization. Theoretical calculations and computer simulations show that the spectral response of the open
Publikováno v:
Solar Energy Materials and Solar Cells. 71:295-312
A new technique, the spectral response of the steady-state photoconductance, is proposed for solar cell characterisation in research and development. The emphasis of this paper is on the evaluation of the carrier collection efficiency of the emitter
Publikováno v:
Applied Surface Science. :633-639
The patterning of thin and thick films (100 nm-2 μm) is performed with excimer laser radiation (A = 248 nm, τ = 20 ns, e max = 5 J/cm 2 ). The laser ablation is investigated for the film systems: Fe 0.6 Co 0.4 /SiO 2 -multilayers, Tb 0.4 Fe 0.6 /Fe
Autor:
Kenneth Varner, Helmut Mackel
Publikováno v:
Progress in Photovoltaics: Research and Applications.
Contactless photoconductance measurements are commonly used to extract the emitter saturation current density (Joe) for crystalline silicon samples containing an emitter on the surface. We review the physics behind the analysis of Joe and compare the
Autor:
Helmut Mackel, Andres Cuevas
Publikováno v:
2006 IEEE 4th World Conference on Photovoltaic Energy Conference.
The minority carrier diffusion length as a function of carrier density has been extracted from the spectral response of the open-circuit voltage of silicon solar cells, which has been measured with the quasi-steady-state spectral photovoltage techniq