Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Helmut H. Toebben"'
Autor:
Vilmar Mollwitz, Helmut H. Toebben, Dirk Kügler, Lothar Bertsch, Bernd Korn, Robert Manuel Geister
Publikováno v:
Proceedings of the Institution of Mechanical Engineers, Part G: Journal of Aerospace Engineering. 228:1586-1597
To test different types of noise abatement approach procedures the Institute of Flight Guidance and the Institute of Aerodynamics and Flow Technology performed flight tests on 6 September 2010 with a Boeing 737-700. In total, 13 approaches to the res
Publikováno v:
Enhanced and Synthetic Vision 2004.
Up to now most Enhanced Vision Systems have been based on IR-sensors. Although the penetration of bad weather (dense fog and light rain) by MMW-radar is remarkably better than in the infrared spectrum MMW sensors still have the disadvantage that rada
Publikováno v:
SPIE Proceedings.
The workload of aircraft crews, especially during taxiing, take-off, approach and landing under adverse weather conditions has heavily increased due to the continuous growth of air traffic. New pilot assistance systems can improve the situational awa
Autor:
L. Raupach, Dirk-Roger Schmitt, Gabriele A. Ringel, Manfred Schrenk, Peter Weissbrodt, Erich J. Hacker, Helmut H. Toebben
Publikováno v:
SPIE Proceedings.
For future spacecrafts a lot of new UV or x-ray instruments are proposed. To enhance resolution and reduce scattering, new optical materials with optical surfaces with a roughness range of about 0.1 nm, i.e. supersmooth surfaces will be used to build
Publikováno v:
Specification, Production, and Testing of Optical Components and Systems.
The power spectral density (PSD) is the most appropriate way to characterize the microroughness of a surface with a spatial wavelength range from several centimeters to a few hundred nanometers. Novel concepts to specify optical surfaces using the PS
Publikováno v:
Specification, Production, and Testing of Optical Components and Systems.
The surface profile and the corresponding power spectral density function achieved by optical or mechanical profilometry operating in xz domain are always affected by probe dimensions and data digitization of the instruments. For mechanical profilome