Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Helene Chauvin"'
Autor:
Guillaume Bascoul, Benoît Viallet, Guy Perez, Giovanna Mura, Helene Chauvin, Gian Paolo Apeddu, Valerio Sanna Valle
Publikováno v:
International Symposium for Testing and Failure Analysis.
Electron Beam Induced Current is a powerful tool for Scanning Electron Microscopy (SEM) imaging mode. In this paper, the history and evolution of this technique are discussed. Some important defects are presented as well as their technological interp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a900fc188495ec6460d3c7e5f844d34
https://doi.org/10.31399/asm.cp.istfa2019p0302
https://doi.org/10.31399/asm.cp.istfa2019p0302
Publikováno v:
Microelectronics Reliability. 55:1770-1774
An upscreening flow has been defined and applied to COTS LED components. It was made possible by the transparent flat glass packaging of the LED, enabling direct visibility of the assembly up to the epitaxy interface through the transparent sapphire
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78948c92151f1c47c280f0214764d964
https://doi.org/10.1016/j.microrel.2015.06.035
https://doi.org/10.1016/j.microrel.2015.06.035