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pro vyhledávání: '"Helbing, F.W."'
: We analyze and stabilize fluctuations of the relative phase between the carrier and the envelope of a mode-locked laser. Mechanisms generating fluctuations of the carrier-envelope-offset (CEO) phase are experimentally identified in lasers with and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______805::956afd7f611520c626092bdcfaf4c3a2
http://doc.rero.ch/record/316364/files/340_2002_Article_898.pdf
http://doc.rero.ch/record/316364/files/340_2002_Article_898.pdf
Publikováno v:
Conference on Lasers & Electro-Optics, 2003. CLEO '03; 2003, p917-920, 4p
Publikováno v:
Applied Physics B: Lasers & Optics; Dec2004, Vol. 79 Issue 8, p1033-1039, 7p
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics; Jul/Aug2003, Vol. 9 Issue 4, p1030-1040, 11p
Autor:
Zhang, Yun1 (AUTHOR) zhangyun18@mails.jlu.edu.cn, Xia, Yu1 (AUTHOR) xiayu22@mails.jlu.edu.cn, Liang, Canneng1 (AUTHOR) liangcn22@mails.jlu.edu.cn, Chen, Anmin1 (AUTHOR) amchen@jlu.edu.cn, Li, Suyu1,2 (AUTHOR) mxjin@jlu.edu.cn, Jin, Mingxing1 (AUTHOR)
Publikováno v:
Sensors (14248220). Nov2023, Vol. 23 Issue 22, p9163. 11p.
Publikováno v:
Applied Physics B: Lasers & Optics. 2002 Supplement, Vol. 74 Issue 9, ps35. 1p.
Autor:
Qi, Pengfei1,2 (AUTHOR), Qian, Wenqi1,2 (AUTHOR), Guo, Lanjun1,2 (AUTHOR), Xue, Jiayun1,2 (AUTHOR), Zhang, Nan1,2 (AUTHOR), Wang, Yuezheng1,2 (AUTHOR), Zhang, Zhi1,3 (AUTHOR), Zhang, Zeliang1,2 (AUTHOR), Lin, Lie1,3 (AUTHOR), Sun, Changlin1,2,4 (AUTHOR), Zhu, Liguo4 (AUTHOR), Liu, Weiwei1,3 (AUTHOR) liuweiwei@nankai.edu.cn
Publikováno v:
Sensors (14248220). Sep2022, Vol. 22 Issue 18, p7076-N.PAG. 49p.
Autor:
Helbing, F.W., Steinmeyer, G., Gallmann, L., Keller, U., Stenger, J., Telle, H.R., Windeler, R.S.
Publikováno v:
Technical Digest. Summaries of Papers Presented at the Conference on Lasers & Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170); 2001, p131-132, 2p
Publikováno v:
Technical Digest. Summaries of Papers Presented at the Conference on Lasers & Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170); 2001, p3-4, 2p
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