Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Heinz-Guenter Walther"'
Publikováno v:
Journal of Applied Physics. 70:4697-4701
The photothermal edge effect was theoretically investigated under the realistic assumption of a Gaussian distributed heating beam, which is not only absorbed at the upper surface of the sample, but because of scattered light also in the vertical plan
Publikováno v:
Journal of Applied Physics. 67:6575-6578
The photothermal surface deformation (PTD) technique is shown to be feasible to separate absorption losses of single‐layer film and substrate absorption from each other by a completely contactless detection of the thermoelastic sample response only
Estimation of depth, width, and magnitude of material inhomogeneities from photothermal measurements
Autor:
Heinz-Guenter Walther, Uwe R. Seidel
Publikováno v:
SPIE Proceedings.
A technique by which subsurface thermal inhomogeneities can be quantitatively reconstructed from photothermal images is discussed. The approach is based on the fact that the photothermal signal can be expressed as the spatial convolution of the photo
Publikováno v:
SPIE Proceedings.
THe use of a photothermal detection system for the study of interacting biomolecules is described. Two different setups are presented to demonstrate the performance of the system by measurements of DNA/intercalator-samples immobilized on membrane sup
Publikováno v:
SPIE Proceedings.
The absorbance of an Au/ZnS/Ge/ thin film system and of Au/ZnS and Au/BaF2 film combinations have been measured as a function of increasing temperature in the infrared spectral range with a photothermal beam deflection arrangement. At an Au/Ge thin f
Autor:
Uwe R. Seidel, Ton Thi Ngoc Lan, Gert Goch, Bernhard Schmitz, Jurgen Geerkens, Heinz-Guenter Walther
Publikováno v:
Optical Engineering. 36:376
Photothermal measurement techniques offer the possibility to determine thermal properties on and below the sample’s surface. Thus, subsurface thermal inhomogeneities such as defects, buried structures, and continuous profiles of thermal parameters
Autor:
Angela Duparré, Heinz-Guenter Walther
Publikováno v:
SPIE Proceedings.
A model describing the modification of a surface roughness profile due to thin film deposition is presented. Surface smoothing as well as roughening are found to be significant effects. Conclusions which can be drawn from the roughness model with res
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