Zobrazeno 1 - 10
of 87
pro vyhledávání: '"Heinrich Theodor Vierhaus"'
Autor:
Nevin George, Guilherme Cardoso Medeiros, Junchao Chen, Josie Esteban Rodriguez Conda, Thomas Lange, Aleksa Damljanovic, Raphael Segabinazzi Ferreira, Aneesh Balakrishnan, Xinhui (Anna) Lai, Shayesteh Masoumian, Dmytro Petryk, Troya Cagil Koylu, Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Cemil Cem Gürsoy, Said Hamdioui, Mottaqiallah Taouil, Milos Krstic, Peter Langendoerfer, Zoya Dyka, Marcelo Brandalero, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Matteo Sonza Reord, Giovanni Squillero, Luca Sterpone, Jaan Raik, Dan Alexandrescu, Maximilien Glorieux, Georgios Selimis, Geert-Jan Schrijen, Anton Klotz, Christian Sauer, Maksim Jenihhin
The demonstrator highlights the various interdependent aspects of Reliability, Security and Quality in nanoelectronics system design within an EDA toolset and a processor architecture setup. The compelling need of attention towards these three aspect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::861be548967445da682d3197a01a7d8a
Autor:
Dan Alexandrescu, Peter Langendörfer, A. Klotz, Milos Krstic, Christian Sauer, Luca Sterpone, Zoya Dyka, Maksim Jenihhin, Heinrich Theodor Vierhaus, Jaan Raik, Mottaqiallah Taouil, Said Hamdioui, M. Sonza Reorda, Geert-Jan Schrijen, Giovanni Squillero, J. Nolte, G. Selimis, M. Huebner
Publikováno v:
DATE
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5c33b94d248d9ac9f1243f9e78ec4c29
Publikováno v:
IFAC-PapersOnLine. 49:390-395
Communication technologies have experienced an explosive development during the last decades, and they are key and standard parts of most of today's integrated as well as field systems or new challenging industrial systems. As industrial robots are a
Publikováno v:
EWME
2018 12th European Workshop on Microelectronics Education (EWME)
2018 12th European Workshop on Microelectronics Education (EWME)
The recently started European Training Network (ETN) RESCUE advances scientific competences in the demanding and mutually dependent aspects of nano-electronic systems design, i.e. reliability, security and quality, as well as related electronic desig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bf3bd4caec9a8ba44841fa36b91e5118
https://zenodo.org/record/3354085
https://zenodo.org/record/3354085
Publikováno v:
DSD
Adaptivity to changing demands is a key feature of many systems in computationally challenging applications. This feature achieved with reconfigurable hardware, providing a good balance between implementation efficiency and flexibility. However, for
Publikováno v:
Digital Design and Fabrication ISBN: 9781315222226
Digital Design and Fabrication
Digital Design and Fabrication
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4687bbe277cd4de749e0d0c3e7d77ae6
https://doi.org/10.1201/9780849386046-22
https://doi.org/10.1201/9780849386046-22
Publikováno v:
SPA
Industrial manufacturing is more and more based groups of robots in production cells. The robots consist of moving, bending and rotating arms with multiple joints. Cables that connect sections of robots undergo heavy stress from stretching and twisti
Publikováno v:
SPA
Due to the features of FPGA architectures such as high performance and reconfiguration at run time, they have become remarkable contenders for many mission critical applications, much beyond rapid prototyping only. As the feature size of the semicond
Publikováno v:
2017 International Conference on Applied Electronics (AE).
Encoders using generator polynomials and linear-feedback shift registers are the key parts of communication technologies widely used in most of today's integrated as well as field systems. This paper presents a detailed comparison of three ways of im
Publikováno v:
IOLTS
Due to the downscaling of transistor feature sizes, nowadays integrated circuits are more vulnerable to various effects that can cause faults during operation. Appropriate mechanisms for handling these faults in the field are required to meet certain