Instrumented open-source filament extruder for research and education.

Autor: de Oliveira Filho M; Materials and Technology Department, School of Engineering, São Paulo State University - UNESP, Av. Ariberto Pereira da Cunha, 333 Guaratinguetá, SP, Brazil., de Jesus MC; Materials and Technology Department, School of Engineering, São Paulo State University - UNESP, Av. Ariberto Pereira da Cunha, 333 Guaratinguetá, SP, Brazil., Nakazato AZ; Materials and Technology Department, School of Engineering, São Paulo State University - UNESP, Av. Ariberto Pereira da Cunha, 333 Guaratinguetá, SP, Brazil., Kondo MY; Materials and Technology Department, School of Engineering, São Paulo State University - UNESP, Av. Ariberto Pereira da Cunha, 333 Guaratinguetá, SP, Brazil., de Oliveira Hein LR; Materials and Technology Department, School of Engineering, São Paulo State University - UNESP, Av. Ariberto Pereira da Cunha, 333 Guaratinguetá, SP, Brazil.

Publikováno v: HardwareX [HardwareX] 2022 Sep 20; Vol. 12, pp. e00362. Date of Electronic Publication: 2022 Sep 20 (Print Publication: 2022).

Correlative light-electron fractography for fatigue striations characterization in metallic alloys.

Autor: Hein LR; LAIMat - Materials Imaging Laboratory, Materials and Technology Department, Faculty of Engineering at Guaratinguetá, UNESP - São Paulo State University, Guaratinguetá, SP, Brazil., de Oliveira JA, de Campos KA

Publikováno v: Microscopy research and technique [Microsc Res Tech] 2013 Sep; Vol. 76 (9), pp. 909-13. Date of Electronic Publication: 2013 Jun 29.

Correlative fractography: combining scanning electron microscopy and light microscopes for qualitative and quantitative analysis of fracture surfaces.

Autor: Hein LR; UNESP-Univ Estadual Paulista, DMT-Department of Materials and Technology, LAIMat-Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410, Brazil. rhein@feg.unesp.br, de Oliveira JA, de Campos KA

Publikováno v: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2013 Apr; Vol. 19 (2), pp. 496-500. Date of Electronic Publication: 2013 Feb 12.

Low voltage and variable-pressure scanning electron microscopy of fractured composites.

Autor: Hein LR; UNESP - Univ Estadual Paulista, DMT - Department of Materials and Technology, LAIMat - Materials Image Analysis Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP 12.516-410, Brazil. rhein@feg.unesp.br, de Campos KA, Caltabiano PC

Publikováno v: Micron (Oxford, England : 1993) [Micron] 2012 Oct; Vol. 43 (10), pp. 1039-49. Date of Electronic Publication: 2012 May 02.

Quantitative fractography by digital image processing: NIH Image macro tools for stereo pair analysis and 3-D reconstruction.

Autor: Hein LR; Laboratório de Análise de Imagens de Materiais (LAIMat), Departamento de Materiais e Tecnologia, Faculdade de Engenharia de Guaratinguetá, Universidade Estadual Paulista, 12.516-410, Guaratinguetá, SP, Brazil. rhein@feg.unesp.br

Publikováno v: Journal of microscopy [J Microsc] 2001 Oct; Vol. 204 (Pt 1), pp. 17-28.