Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Heimo Hartlieb"'
Autor:
Endri Kaja, Wolfgang Ecker, Keerthikumara Devarajegowda, Zhao Han, Heimo Hartlieb, Varsha Bhupal Bavache
Publikováno v:
2020 17th Biennial Baltic Electronics Conference (BEC).
Fault tolerance enables the system to avoid threats (fail-safe) or continue with its safe operational functionality even in the presence of random faults. This ability comes at the cost of additional development efforts and the silicon overhead requi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::038b32f3b4e5488d40ad137bcc95ca72
https://doi.org/10.1109/bec49624.2020.9276994
https://doi.org/10.1109/bec49624.2020.9276994
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7e0d3d4c8d29ece875987e979f736e10
https://doi.org/10.4271/2010-01-0371
https://doi.org/10.4271/2010-01-0371
Publikováno v:
ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC); 2015, p1-9, 9p
Publikováno v:
IEEE Journal of Solid-State Circuits; 02/01/2011, Vol. 46 Issue 3, p706-716, 11p
Publikováno v:
e & i Elektrotechnik und Informationstechnik; Sep2010, Vol. 127 Issue 9, pa3-a41, 39p
Publikováno v:
e & i Elektrotechnik und Informationstechnik; Sep2000, Vol. 117 Issue 9, p616-618, 3p
Publikováno v:
e & i Elektrotechnik und Informationstechnik; Sep2000, Vol. 117 Issue 9, p618-619, 2p