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Overcoming the reliability limitation in the ultimately scaled DRAM using silicon migration technique by hydrogen annealing

Autor: Jung Ho Shin, Min-Soo Yoo, Sung-Joo Hong, Yong-Taik Kim, Tae-Kyung Oh, Tae-Su Jang, Kyung Kyu Min, Donghoon Nam, Heimi Kwon, Seong-Wan Ryu

Publikováno v: 2017 IEEE International Electron Devices Meeting (IEDM).

We demonstrated a highly reliable buried-gate saddle-fin cell-transistor (cell-TR) using silicon migration technique of hydrogen (H 2 ) annealing after a dry etch to form the saddle-fin in a fully integrated 2y-nm 4Gb DRAM. It clearly shows a reducti

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9ecc4366a8e576cbe5bcf1385d2c933d
https://doi.org/10.1109/iedm.2017.8268437

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Effects of High Current and Welding Wire Diameter on the Magnesium Vaporization and Mechanical Properties of Al5083 Arc Welds

Autor: In-Pyo Hong, Heimi Kwon, Chul-Ho Park, Namhyun Kang

Publikováno v: Journal of the Korean Welding and Joining Society. 31:84-89

The demand of LNG tank and the constituting material, i.e., the Al5083 thick plate, increased due to the rapid growth LNG market. To weld the Al5083 thick plate, the gas metal arc welding (GMAW) of high current is necessary to increase manufacturing

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7809152ef95dcd78be595c798b20d114
https://doi.org/10.5781/kwjs.2013.31.6.84

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