Zobrazeno 1 - 10
of 261
pro vyhledávání: '"Heilweil EJ"'
Autor:
Meyers A; Department of Chemistry and Physics, Hood College, Frederick, Maryland 21701-8524, United States., Heilweil EJ; Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States., Stromberg CJ; Department of Chemistry and Physics, Hood College, Frederick, Maryland 21701-8524, United States.
Publikováno v:
The journal of physical chemistry. A [J Phys Chem A] 2021 Feb 25; Vol. 125 (7), pp. 1413-1423. Date of Electronic Publication: 2021 Feb 10.
Autor:
Magnanelli TJ, Heilweil EJ
Publikováno v:
Optics express [Opt Express] 2020 Mar 02; Vol. 28 (5), pp. 7221-7236.
Autor:
Magnanelli TJ; Physical, Measurement Laboratories, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA., Engmann S; Physical, Measurement Laboratories, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA.; Theiss Research, La Jolla, CA, 92036, USA., Wahlstrand JK; Physical, Measurement Laboratories, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA., Stephenson JC; Physical, Measurement Laboratories, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA., Richter LJ; Material, Measurement Laboratories, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA., Heilweil EJ; Physical, Measurement Laboratories, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA.
Publikováno v:
The journal of physical chemistry. C, Nanomaterials and interfaces [J Phys Chem C Nanomater Interfaces] 2020; Vol. 124 (13).
Autor:
Thornley W; Department of Chemistry , University of Idaho , 875 Perimeter Drive , MS 2343, Moscow , Idaho 83844-2343 , United States., Wirick SA; Department of Chemistry and Physics , Hood College , 401 Rosemont Avenue , Frederick , Maryland 21701-8524 , United States., Riedel-Topper M; Department of Chemistry and Physics , Hood College , 401 Rosemont Avenue , Frederick , Maryland 21701-8524 , United States., DeYonker NJ; Department of Chemistry , The University of Memphis , 411 Smith Hall, 3744 Walker Avenue , Memphis , Tennessee 38152 , United States., Bitterwolf TE; Department of Chemistry , University of Idaho , 875 Perimeter Drive , MS 2343, Moscow , Idaho 83844-2343 , United States., Stromberg CJ; Department of Chemistry and Physics , Hood College , 401 Rosemont Avenue , Frederick , Maryland 21701-8524 , United States., Heilweil EJ; Nanoscale Device Characterization Division, Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899-8443 , United States.
Publikováno v:
The journal of physical chemistry. B [J Phys Chem B] 2019 Aug 22; Vol. 123 (33), pp. 7137-7148. Date of Electronic Publication: 2019 Aug 08.
Autor:
Wahlstrand JK, Heilweil EJ
Publikováno v:
Optics express [Opt Express] 2018 Nov 12; Vol. 26 (23), pp. 29848-29853.
Autor:
Biacchi AJ; Nanoelectronics Group, Engineering Physics Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States., Le ST; Nanoelectronics Group, Engineering Physics Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States.; Theiss Research , La Jolla , California 92037 , United States., Alberding BG; Remote Sensing Group, Sensor Science Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States., Hagmann JA; Nanoelectronics Group, Engineering Physics Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States., Pookpanratana SJ; Nanoelectronics Group, Engineering Physics Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States., Heilweil EJ; Nanoelectronics Group, Engineering Physics Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States., Richter CA; Nanoelectronics Group, Engineering Physics Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States., Hight Walker AR; Nanoelectronics Group, Engineering Physics Division , National Institute of Standards and Technology (NIST) , Gaithersburg , Maryland 20899 , United States.
Publikováno v:
ACS nano [ACS Nano] 2018 Oct 23; Vol. 12 (10), pp. 10045-10060. Date of Electronic Publication: 2018 Sep 28.
Autor:
Bakker H; Amolf , Amsterdam , The Netherlands., Meech SR; University of East Anglia , Norwich , U.K., Heilweil EJ; NIST , Gaithersburg , Maryland , United States.
Publikováno v:
The journal of physical chemistry. A [J Phys Chem A] 2018 May 10; Vol. 122 (18), pp. 4389.
Autor:
Stromberg CJ; Department of Chemistry and Physics , Hood College , 401 Rosemont Avenue , Frederick , Maryland 21701-8524 , United States.; Engineering Physics Division, Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899-8443 , United States., Heilweil EJ; Department of Chemistry and Physics , Hood College , 401 Rosemont Avenue , Frederick , Maryland 21701-8524 , United States.; Engineering Physics Division, Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899-8443 , United States.
Publikováno v:
The journal of physical chemistry. A [J Phys Chem A] 2018 Apr 26; Vol. 122 (16), pp. 4023-4030. Date of Electronic Publication: 2018 Apr 18.
Autor:
Aytekin YS; Department of Chemistry, Middle East Technical University, Ankara 06100, Turkey., Köktürk M; Nobel Pharmaceuticals Research and Development Center, Düzce 81100, Turkey., Zaczek A; Department of Chemistry, Syracuse University, Syracuse, NY 13244-4100, USA., Korter TM; Department of Chemistry, Syracuse University, Syracuse, NY 13244-4100, USA., Heilweil EJ; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Esenturk O; Department of Chemistry, Middle East Technical University, Ankara 06100, Turkey.
Publikováno v:
Chemical physics [Chem Phys] 2018; Vol. 512.
Autor:
Riedel-Topper M; Department of Chemistry and Physics, Hood College, 401 Rosemont Ave, Frederick, MD 21710., Wirick S; Department of Chemistry and Physics, Hood College, 401 Rosemont Ave, Frederick, MD 21710., Hadler JA; Applied Physics Division, Physical Measurement Laboratory, NIST Boulder, CO 80305., Alberding BG; Engineering Physics Division, Physical Measurement Laboratory, NIST Gaithersburg, MD 20899., Stromberg CJ; Department of Chemistry and Physics, Hood College, 401 Rosemont Ave, Frederick, MD 21710., Heilweil EJ; Engineering Physics Division, Physical Measurement Laboratory, NIST Gaithersburg, MD 20899.
Publikováno v:
Journal of laser applications [J Laser Appl] 2018; Vol. 30.