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Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques

Autor: Fakhri, M., Geinzer, A.-K., Heiderhoff, R., Balk, L.J.

Publikováno v: In Microelectronics Reliability 2010 50(9):1459-1463

Physical Origin of Negative Differential Resistance in V 3 O 5 and Its Application as a Solid-State Oscillator.

Autor: Das SK; Research School of Physics, The Australian National University, Canberra, ACT, 2601, Australia.; Department of Physics, Jahangirnagar University, Dhaka, 1342, Bangladesh., Nandi SK; Research School of Physics, The Australian National University, Canberra, ACT, 2601, Australia., Marquez CV; Department of Physics, University of Puerto Rico, Mayaguez, PR, 00681, USA., Rúa A; Department of Physics, University of Puerto Rico, Mayaguez, PR, 00681, USA., Uenuma M; Information Device Science Laboratory, Nara Institute of Science and Technology (NAIST), Nara, 630-0192, Japan., Puyoo E; Université Lyon, INSA Lyon, CNRS, Ecole Centrale de Lyon, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Villeurbanne, 69621, France., Nath SK; Research School of Physics, The Australian National University, Canberra, ACT, 2601, Australia.; Department of Electrical, Electronic and Computer Engineering, The University of Western Australia, Crawley, WA, 6009, Australia., Albertini D; Université Lyon, INSA Lyon, CNRS, Ecole Centrale de Lyon, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Villeurbanne, 69621, France., Baboux N; Université Lyon, INSA Lyon, CNRS, Ecole Centrale de Lyon, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Villeurbanne, 69621, France., Lu T; Research School of Chemistry, The Australian National University, Canberra, ACT, 2601, Australia., Liu Y; Research School of Chemistry, The Australian National University, Canberra, ACT, 2601, Australia., Haeger T; Institute of Electronic Devices, Wuppertal Center for Smart Materials & Systems, University of Wuppertal, Rainer-Gruenter-Strasse 21, 42119, Wuppertal, Germany., Heiderhoff R; Institute of Electronic Devices, Wuppertal Center for Smart Materials & Systems, University of Wuppertal, Rainer-Gruenter-Strasse 21, 42119, Wuppertal, Germany., Riedl T; Institute of Electronic Devices, Wuppertal Center for Smart Materials & Systems, University of Wuppertal, Rainer-Gruenter-Strasse 21, 42119, Wuppertal, Germany., Ratcliff T; Research School of Physics, The Australian National University, Canberra, ACT, 2601, Australia., Elliman RG; Research School of Physics, The Australian National University, Canberra, ACT, 2601, Australia.

Publikováno v: Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2023 Feb; Vol. 35 (8), pp. e2208477. Date of Electronic Publication: 2022 Dec 30.

Scanning near field thermal microscopy on a micromachined thin membrane

Autor: Altes, A., Mutamba, K., Heiderhoff, R., Hartnagel, H.L., Balk, L.J.

Publikováno v: In Superlattices and Microstructures 2004 35(3):465-476

Near-field cathodoluminescence of nanoscopic diamond properties

Autor: Heiderhoff, R. ^*, Cramer, R.M., Sergeev, O.V., Balk, L.J.

Publikováno v: In Diamond & Related Materials 2001 10(9):1647-1651