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pro vyhledávání: '"Heerens, G.J."'
Autor:
Orlic, B., Wollenweber, J., Geel, C.R., Vandeweijer, V.P., Meekes, J.A., Heerens, G.J., TerHeege, J.H.
Publikováno v:
53rd U.S. Rock Mechanics/Geomechanics Symposium, 53rd U.S. Rock Mechanics/Geomechanics Symposium, 23 June 2019 through 26 June 2019, 1-7
Rock salt formations are a common reservoir seal worldwide with excellent sealing capacity. Restoring the sealing capacity of rock salt caprocks penetrated by wells using the same rock salt as plugging material is therefore an attractive, safe and en
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4c49a00de4adc4e1014f4a0dce3281dd
http://resolver.tudelft.nl/uuid:0e9ad5cf-4d87-4cf9-880d-b9f22064a683
http://resolver.tudelft.nl/uuid:0e9ad5cf-4d87-4cf9-880d-b9f22064a683
Publikováno v:
2009 ASME Pressure Vessels and Piping Conference, PVP 2009, 26-30 July 2009, Prague, Czechoslovakia, 225-230
Corrosion and erosion are two major degradation mechanisms of piping systems and pipelines that both lead to wall thickness loss. To ensure sufficient integrity levels of these assets NDE is currently conducted at time based intervals often associate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dad9f502b6955f7ba34371957cda3bce
http://resolver.tudelft.nl/uuid:65247d32-91bc-4d1e-acda-286991b00f8d
http://resolver.tudelft.nl/uuid:65247d32-91bc-4d1e-acda-286991b00f8d
Autor:
Moors, R., Heerens, G.J.
Publikováno v:
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 1, 20, 316-320
Electrostatic protection of mask for extreme ultraviolet lithography (EUVL) was discussed. Both charged and neutral particles could be prevented from moving towards the mask by choosing a nonuniform electrical field. Benefits of electrostatic protect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1870739421b6009d3a988ca91fa17979
http://resolver.tudelft.nl/uuid:1b19bf74-6d1f-4198-bc99-8684157a7fc1
http://resolver.tudelft.nl/uuid:1b19bf74-6d1f-4198-bc99-8684157a7fc1
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Conference
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