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pro vyhledávání: '"Haueisen, V."'
Autor:
Beinert, A., Büchler, A., Romer, P., Haueisen, V., Rendler, L.C., Schubert, M.C., Heinrich, M., Aktaa, J., Eitner, U.
Understanding the origin of thermomechanical stress in solar cells is a key factor to extend the lifetime of photovoltaic modules. However, the methods to determine the stress are very limited. With the confocal micro-Raman spectroscopy, we present a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::f2d8d6c7d73ee182bf8f060cc3da8895
https://publica.fraunhofer.de/handle/publica/257720
https://publica.fraunhofer.de/handle/publica/257720
Publikováno v:
Energy procedia, 124, 464-469
Raman spectroscopy is used for measuring stress in microelectronic devices [1] as well as in solar cells [2, 3]. However, on PV module level it has not been examined yet. We transfer the method in order to enable the experimental determination of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3d161e119ffceff2a43946ca89441697
https://publica.fraunhofer.de/handle/publica/251249
https://publica.fraunhofer.de/handle/publica/251249
Autor:
Büchler, A., Beinert, A., Kluska, S., Haueisen, V., Romer, P., Heinz, F.D., Glatthaar, M., Schubert, M.
Confocal micro-Raman spectroscopy allows for spatially resolved measurements of the phonon energy in silicon, which is correlated to mechanical stress. Mechanical stress is a tensorial quantity. For the confocal measurement geometry and certain cryst
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::59008360e0d5909650c47ddcd2922f7e
https://publica.fraunhofer.de/handle/publica/251065
https://publica.fraunhofer.de/handle/publica/251065
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