Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Hassan N. Al‐Obaidi"'
Publikováno v:
Ibn Al-Haitham Journal for Pure and Applied Sciences, Vol 28, Iss 2 (2017)
An analytical procedure has been carried out to measure the charge that may be trapped in an insulator sample of scanning electron microscope. It mainly concerns the determination of the deduced polarization charges by means of mirror effect phenomen
Externí odkaz:
https://doaj.org/article/f5dfe29f5789480ebc43c3e60234a409
Publikováno v:
Journal of Microscopy. 286:245-251
The process of examining and analysing insulating materials using a scanning electron microscope usually accompanied by an important phenomenon called the mirror effect or charging effects. Such effects arise due to the ability of insulators to trapp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e24cb33ef4b792e7504cad3aa088ecf1
https://doi.org/10.1111/jmi.13103
https://doi.org/10.1111/jmi.13103
Autor:
Imad H. Khaleel, Hassan N. Al-Obaidi
Publikováno v:
Iraqi Journal of Physics. 11:12-19
A computational investigation is carried out to describe the behaviour of reflected electrons upon a charged insulator sample and producing mirror effect images. A theoretical expression for the scanning electron path equation is derived concerning R
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::935f9198d2a0ac103e166dec13f9f496
https://doi.org/10.30723/ijp.v11i21.362
https://doi.org/10.30723/ijp.v11i21.362
Publikováno v:
Ultramicroscopy. 184:12-16
Accumulation of charges (electrons) at the specimen surface in scanning electron microscope (SEM) lead to generate an electrostatic potential. By using the method of image charges, this potential is defined in the chamber's space of such apparatus. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b6dbe41adc3ebdb0af6e5a05b30704f
https://doi.org/10.1016/j.ultramic.2017.08.001
https://doi.org/10.1016/j.ultramic.2017.08.001
Publikováno v:
Journal of Physics: Conference Series. 1879:032105
The electron mirror phenomenon has been explored to describe the behavior of a probing electron trajectory inside the chamber of scanning electron microscope (SEM). This investigation has been carried out by means of the modulated mirror plot curve t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2bc151d9461a853cb1a99f82a5fcae8
https://doi.org/10.1088/1742-6596/1879/3/032105
https://doi.org/10.1088/1742-6596/1879/3/032105
Publikováno v:
Optik. 127:6978-6981
A theoretical investigation of electron behavior inside the scanning electron microscope chamber for the mirror image operation mode has been carried out. The equation of motion of this head-incident electron is derived in terms of the energy conserv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dd916851fd9f4a9ff8c720a454ef710
https://doi.org/10.1016/j.ijleo.2016.05.017
https://doi.org/10.1016/j.ijleo.2016.05.017
Autor:
Hassan N. Al-Obaidi
Publikováno v:
Journal of Electrostatics. 74:102-107
In a scanning electron microscope the influence of electronic beam parameters on the electron-mirror images has been investigated. A simple theoretical model for scanning electron beam behavior in terms of beam and surface potentials is presented. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c778ca3bf2fd8930099aadcd16626b2a
https://doi.org/10.1016/j.elstat.2015.01.004
https://doi.org/10.1016/j.elstat.2015.01.004
Publikováno v:
JOURNAL OF ADVANCES IN PHYSICS. 5:778-789
Current research presents a visual-computational tool to design and investigate round electrostatic lenses in sense of analysis procedure. The finite elements methods is adopted to find the electrostatic potential in the lens region. Laplace’s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e8a723a733c011af1e8bd782f009380
https://doi.org/10.24297/jap.v5i2.1954
https://doi.org/10.24297/jap.v5i2.1954
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 571:012126
The minimum approaches distance of probing electrons in scanning electron microscope has investigated in accordance to mirror effect phenomenon. The analytical expression for such distance is decomposed using the binomial expansion. With aid of resul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6548dc9c7999fd8b47b7bced696974d8
https://doi.org/10.1088/1757-899x/571/1/012126
https://doi.org/10.1088/1757-899x/571/1/012126
Autor:
Hassan N. Al-Obaidi, Imad H. Khaleel
Publikováno v:
International Letters of Chemistry, Physics and Astronomy. 15:70-75
A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::77bd1360ae002b4d052eb7e366dadcdb
https://doi.org/10.18052/www.scipress.com/ilcpa.15.70
https://doi.org/10.18052/www.scipress.com/ilcpa.15.70