Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Hasaka, Satoshi"'
Autor:
Shinriki, Manabu, Chung, Keith, Hasaka, Satoshi, Brabant, Paul, He, Hong, Adam, Thomas N., Sadana, Devendra
Publikováno v:
In Thin Solid Films 1 February 2012 520(8):3190-3194
Autor:
He, Hong, Brabant, Paul, Chung, Keith, Shinriki, Manabu, Adam, Thomas, Reznicek, Alexander, Sadana, Devendra, Hasaka, Satoshi, Francis, Terry
Publikováno v:
In Thin Solid Films 1 February 2012 520(8):3175-3178
Autor:
Fukuda, Yasushi, Orita, Takashi, Akutsu, Nakao, Ikenaga, Kazutada, Koseki, Syuuichi, Matsumoto, Koh, Hasaka, Satoshi
Publikováno v:
In Journal of Crystal Growth 2007 298:433-436
Akademický článek
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Autor:
Chung, Keith H., Brabant, Paul, Shinriki, Manabu, Hasaka, Satoshi, Francis, Terry, and, Hong He, Sadana, Devendra K.
Publikováno v:
ECS Transactions; April 2012, Vol. 45 Issue: 6 p69-80, 12p
Autor:
Shimizu, Hideharu, Tajima, Nobuo, Kada, Takeshi, Nagano, Shuji, Ohashi, Yoshi, Hasaka, Satoshi
Publikováno v:
Japanese Journal of Applied Physics; May 2010, Vol. 49 Issue: 5 p05FF02-05FF05, 4p
Autor:
Nakahira, Junya, Nagano, Shuji, Gawase, Akifumi, Ohashi, Yoshi, Shimizu, Hideharu, Chikaki, Shinichi, Oda, Noriaki, Kondo, Seiichi, Hasaka, Satoshi, Saito, Shuichi
Publikováno v:
Japanese Journal of Applied Physics; May 2010, Vol. 49 Issue: 5 p05FD04-05FD08, 5p
Autor:
Tokunaga, Hiroki, Fukuda, Yasushi, Ubukata, Akinori, Ikenaga, Kazutada, Inaishi, Yoshiaki, Orita, Takashi, Hasaka, Satoshi, Kitamura, Yuichiro, Yamaguchi, Akira, Koseki, Shuichi, Uematsu, Kunimasa, Tomita, Nobuyasu, Akutsu, Nakao, Matsumoto, Koh
Publikováno v:
Physica Status Solidi (C); Jul2008, Vol. 5 Issue 9, p3017-3019, 3p
Autor:
Ohashi, Yoshi, Tajima, Nobuo, Xu, Yonghua, Kada, Takeshi, Nagano, Shuji, Shimizu, Hideharu, Hasaka, Satoshi
Publikováno v:
Japanese Journal of Applied Physics; May 2010, Vol. 49 Issue: 5 p05FF03-05FF05, 3p
Autor:
Yamazaki, Hirohisa, Sakai, Masanori, Miya, Hironobu, Shibata, Toshinori, Inoue, Minoru, Hasaka, Satoshi
Publikováno v:
2008 International Symposium on Semiconductor Manufacturing (ISSM); 2008, p317-318, 2p