Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Harteveld, C. A. M."'
Autor:
Grishina, D. A., Harteveld, C. A. M., Pacureanu, A., Devashish, D., Lagendijk, A., Cloetens, P., Vos, W. L.
Publikováno v:
ACS Nano 13, 13932-13939 (2019)
To investigate the performance of three-dimensional (3D) nanostructures, it is vital to study in situ their internal structure non-destructively. Hence, we perform synchrotron X-ray holographic tomography on exemplary 3D silicon photonic band gap cry
Externí odkaz:
http://arxiv.org/abs/1808.01392
We have performed an x-ray holotomography study of a three-dimensional (3D) photonic band gap crystal. The crystals was made from silicon by CMOS-compatible methods. We manage to obtain the 3D material density throughout the fabricated crystal. We ob
Externí odkaz:
http://arxiv.org/abs/1610.02051
Publikováno v:
Nanotechnology 26, 505302: 1-10 (2015)
Current nanostructure fabrication by etching is usually limited to planar structures as they are defined by a planar mask. The realisation of three-dimensional (3D) nanostructures by etching requires technologies beyond planar masks. We present a met
Externí odkaz:
http://arxiv.org/abs/1505.08035
Publikováno v:
Scopus-Elsevier
European Conference on Lasers and Electro-Optics, CLEO 2015
European Conference on Lasers and Electro-Optics, CLEO 2015
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::0d2b7e6a1b7bc84afebf4fdc2c845dd2
http://www.scopus.com/inward/record.url?eid=2-s2.0-85019515326&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-85019515326&partnerID=MN8TOARS