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pro vyhledávání: '"Harsh Pokharna"'
Autor:
Harsh Pokharna, Gary S. Schajer
Publikováno v:
Optics and Lasers in Engineering. 121:181-188
Phase-stepped ESPI measurement techniques typically require the acquisition of sets of speckle images before and after specimen deformation. This process limits the use of the technique to quasi-static specimens. A novel technique is proposed here wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a922d44fc7cb5ad6d3c397c39c44dbb
https://doi.org/10.1016/j.optlaseng.2019.04.012
https://doi.org/10.1016/j.optlaseng.2019.04.012
