Focal-plane detector system for the KATRIN experiment

Autor: Amsbaugh, J.F., Barrett, J., Beglarian, A., Bergmann, T., Bichsel, H., Bodine, L.I., Bonn, J., Boyd, N.M., Burritt, T.H., Chaoui, Z., Chilingaryan, S., Corona, T.J., Doe, P.J., Dunmore, J.A., Enomoto, S., Formaggio, J.A., Fränkle, F.M., Furse, D., Gemmeke, H., Glück, F., Harms, F., Harper, G.C., Hartmann, J., Howe, M.A., Kaboth, A., Kelsey, J., Knauer, M., Kopmann, A., Leber, M.L., Martin, E.L., Middleman, K.J., Myers, A.W., Oblath, N.S., Parno, D.S., Peterson, D.A., Petzold, L., Phillips, D.G., II, Renschler, P., Robertson, R.G.H., Schwarz, J., Steidl, M., Tcherniakhovski, D., Thümmler, T., Van Wechel, T.D., VanDevender, B.A., Vöcking, S., Wall, B.L., Wierman, K.L., Wilkerson, J.F., Wüstling, S.

Publikováno v: In Nuclear Inst. and Methods in Physics Research, A 1 April 2015 778:40-60

Astroparticle physics with a customized low-background broad energy Germanium detector

Autor: Aalseth, C.E., Amman, M., Avignone, F.T., III, Back, H.O., Barabash, A.S., Barbeau, P.S., Bergevin, M., Bertrand, F.E., Boswell, M., Brudanin, V., Bugg, W., Burritt, T.H., Busch, M., Capps, G., Chan, Y.-D., Collar, J.I., Cooper, R.J., Creswick, R., Detwiler, J.A., Diaz, J., Doe, P.J., Efremenko, Yu., Egorov, V., Ejiri, H., Elliott, S.R., Ely, J., Esterline, J., Farach, H., Fast, J.E., Fields, N., Finnerty, P., Fujikawa, B., Fuller, E., Gehman, V.M., Giovanetti, G.K., Guiseppe, V.E., Gusey, K., Hallin, A.L., Harper, G.C., Hazama, R., Henning, R., Hime, A., Hoppe, E.W., Hossbach, T.W., Howe, M.A., Johnson, R.A., Keeter, K.J., Keillor, M., Keller, C., Kephart, J.D., Kidd, M.F., Knecht, A., Kochetov, O., Konovalov, S.I., Kouzes, R.T., Leviner, L., Loach, J.C., Luke, P.N., MacMullin, S., Marino, M.G., Martin, R.D., Mei, D.-M., Miley, H.S., Miller, M.L., Mizouni, L., Meyers, A.W., Nomachi, M., Orrell, J.L., Peterson, D., Phillips, D.G., II, Poon, A.W.P., Prior, G., Qian, J., Radford, D.C., Rielage, K., Robertson, R.G.H., Rodriguez, L., Rykaczewski, K.P., Salazar, H., Schubert, A.G., Shima, T., Shirchenko, M., Steele, D., Strain, J., Swift, G., Thomas, K., Timkin, V., Tornow, W., Van Wechel, T.D., Vanyushin, I., Varner, R.L., Vetter, K., Wilkerson, J.F., Wolfe, B.A., Xiang, W., Yakushev, E., Yaver, H., Young, A.R., Yu, C.-H., Yumatov, V., Zhang, C., Zimmerman, S.

Publikováno v: In Nuclear Inst. and Methods in Physics Research, A 2011 652(1):692-695

Dead layer on silicon p–i–n diode charged-particle detectors

Autor: Wüstling, S., VanDevender, B.A., Wall, B.L., Schwarz, J., Peterson, D.A., Wilkerson, J.F., Bodine, L.I., Parno, D.S., Howe, M.A., Van Wechel, T.D., Martin, E.L., Renschler, P., Bichsel, H.C., Chaoui, Z., Harper, G.C., Beglarian, A., Boyd, N.M., Enomoto, S., Petzold, L., Doe, P.J., Harms, F., Wierman, K.J., Robertson, R.G.H., Bergmann, T., Corona, T.J., Burritt, T.H., Amsbaugh, J.F., Steidl, M.

Semiconductor detectors in general have a dead layer at their surfaces that is either a result of natural or induced passivation, or is formed during the process of making a contact. Charged particles passing through this region produce ionization th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f8c0a5c6b5060f751094e64b85ffa6d2

Dead layer measurements for KATRIN prototype PIN diode array.

Autor: Wall, B.L., Burritt, T.H., Doe, P.J., Fredericks, C., Gemmeke, H., Harper, G.C., Howe, M.A., Leber, M., Myers, A.W., Robertson, R.G.H., Steidl, M., VanDevender, B.A., Van Wechel, T.D., Wustling, S., Wilkerson, J.F.

Publikováno v: 2006 IEEE Nuclear Science Symposium Conference Record; 2006, p204-207, 4p

The management of behaviour problems in young children.

Autor: Chazan, M., Laing, A.F., Jones, J., Harper, G.C., Bolton, J.

Publikováno v: Early Child Development & Care; Jan1983, Vol. 11 Issue 3/4, p227-244, 18p