Zobrazeno 1 - 10
of 128
pro vyhledávání: '"Harold. P. Hjalmarson"'
Autor:
Peter A. Schultz, Arthur H. Edwards, Renee M. Van Ginhoven, Harold P. Hjalmarson, Andrew M. Mounce
Publikováno v:
Physical Review B. 107
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13f4cfa25dc3b86b8f0f97478472545d
https://doi.org/10.1103/physrevb.107.205202
https://doi.org/10.1103/physrevb.107.205202
Autor:
Jack D. Flicker, Luciano Andres Garcia Rodriguez, Jacob Mueller, Lee Gill, Jason C. Neely, Emily Schrock, Harold P. Hjalmarson, Enrico Bellotti, Peter A. Schultz, Jane M. Lehr, Gregory Pickrell, Robert Kaplar
Publikováno v:
Power Systems ISBN: 9783031265716
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13a049ae3b514fe7da4c11f7229161a9
https://doi.org/10.1007/978-3-031-26572-3_9
https://doi.org/10.1007/978-3-031-26572-3_9
Autor:
Peter A. Schultz, Harold P. Hjalmarson
Publikováno v:
Physical Review B. 105
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::396006d51bfbf0c3e42f70cef389253b
https://doi.org/10.1103/physrevb.105.224111
https://doi.org/10.1103/physrevb.105.224111
Autor:
Harold. P. Hjalmarson, Steven C. Witczak, Samuel Z. Roark, Renee Van Ginhoven, Thomas Buchheit, Hugh Barnaby, Philippe Adell
Publikováno v:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e7d44a333754ea2b38834997ec4eb13
https://doi.org/10.1109/radecs53308.2021.9954578
https://doi.org/10.1109/radecs53308.2021.9954578
Autor:
Taisuke Ohta, Ezra Bussmann, Peter A. Schultz, Morgann Berg, Harold P. Hjalmarson, Chris H. Moore, David Scrymgeour
Publikováno v:
Physical Review B. 103
The stability of low-index platinum surfaces and their electronic properties is investigated with density functional theory, toward the goal of understanding the surface structure and electron emission, and identifying precursors to electrical breakd
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cff89db2dd3b1f31ff0052c2dcf3eb05
https://doi.org/10.1103/physrevb.103.195427
https://doi.org/10.1103/physrevb.103.195427
Autor:
Morgann Berg, Sean W. Smith, David A. Scrymgeour, Michael T. Brumbach, Ping Lu, Sara M. Dickens, Joseph R. Michael, Taisuke Ohta, Ezra Bussmann, Harold P. Hjalmarson, Peter A. Schultz, Paul G. Clem, Matthew M. Hopkins, Christopher H. Moore
Structural disorder causes materials’ surface electronic properties, e.g., work function ([Formula: see text]), to vary spatially, yet it is challenging to prove exact causal relationships to underlying ensemble disorder, e.g., roughness or granula
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cb8d6fcb9578d0fb847d9c7fb69bd99e
Autor:
Matthew J. Marinella, Brian D. Tierney, Harold P. Hjalmarson, Robin B. Jacobs-Gedrim, Conrad D. James, Sapan Agarwal
Publikováno v:
Applied Physics A. 124
A unified physics-based model of electron transport in metal-insulator-metal (MIM) systems is presented. In this model, transport through metal-oxide interfaces occurs by electron tunneling between the metal electrodes and oxide defect states. Transp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2d351d50dc381004f99013e95c03b010
https://doi.org/10.1007/s00339-018-1632-3
https://doi.org/10.1007/s00339-018-1632-3
Autor:
Harold P. Hjalmarson, Jason D. Serrano, Matthew J. Marinella, Don Hanson, Roy P. Cuoco, J. Kyle McDonald, David Russell Hughart, Michael Lee McLain, E. Fredrick Hartman
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The effects of temperature on the total ionizing dose (TID) response of tantalum oxide (TaO x ) memristive bit cells are investigated. The TaO x devices were manufactured by Sandia National Laboratories (SNL). In-situ data were obtained as a function
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab9ed8a423eabea1d1d3bbb97345c9a0
https://doi.org/10.1109/radecs.2017.8696164
https://doi.org/10.1109/radecs.2017.8696164
Autor:
Tim J. Sheridan, Don Hanson, Kyle McDonald, Patrick R. Mickel, Matthew J. Marinella, David Russell Hughart, Harold P. Hjalmarson, Michael Lee McLain
Publikováno v:
IEEE Transactions on Nuclear Science. 61:2997-3004
This paper investigates the effects of high dose rate ionizing radiation and total ionizing dose (TID) on tantalum oxide (TaOx) memristors. Transient data were obtained during the pulsed exposures for dose rates ranging from approximately 5.0 ×107 r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b8e2269908598adb9558efa3d95a80d
https://doi.org/10.1109/tns.2014.2364521
https://doi.org/10.1109/tns.2014.2364521
(Invited) Development, Characterization, and Modeling of a TaOx ReRAM for a Neuromorphic Accelerator
Autor:
James B. Aimone, Seth Decker, Conrad D. James, Fredrick Rothganger, Roger Apodaca, Robert J. Bondi, James E. Stevens, Andrew J. Lohn, Patrick R. Mickel, Brian Robert Evans, Erik P. DeBenedictis, David Russell Hughart, Harold P. Hjalmarson, Matthew Marinella, Denis Mamaluy
Publikováno v:
ECS Transactions. 64:37-42
Resistive random access memory (ReRAM), or memristors, may be capable of significantly improving the efficiency of neuromorphic computing, when used as a central component of an analog hardware accelerator. However, the significant electrical variati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9581db71c5954a56753a6526b984365f
https://doi.org/10.1149/06414.0037ecst
https://doi.org/10.1149/06414.0037ecst