Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Harold L. Steinberg"'
Publikováno v:
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
The use of the ellipsometer for the measurement of the thickness and refractive index of very thin films is reviewed. The Poincare sphere representation of the state of polariza tion of light is developed and used to describe the reflection process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::26ba3fb9bcbefed0df5a57d7cab01519
https://pubmed.ncbi.nlm.nih.gov/31580576
https://pubmed.ncbi.nlm.nih.gov/31580576
