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Publikováno v:
Tokumaru, William; Talukdar, Ishan; & Haeffner, Harmut. (2016). Fourier Transform Infrared Analysis of Surface Ion Traps. Berkeley Scientific Journal, 21(1). Retrieved from: http://www.escholarship.org/uc/item/0q08m6wn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::00eb17778785d3026cd635674480a8ca
http://www.escholarship.org/uc/item/0q08m6wn
http://www.escholarship.org/uc/item/0q08m6wn