Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Harder RJ"'
Autor:
Hofmann, F, Tarleton, E, Harder, RJ, Phillips, NW, Ma, P-W, Clark, JN, Robinson, IK, Abbey, B, Liu, W, Beck, CE
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+ ), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the na
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d72250018fe30d72928ae3b61f545a29
https://doi.org/10.1038/srep45993
https://doi.org/10.1038/srep45993
Akademický článek
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Akademický článek
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Autor:
Rebuffi L, Kandel S, Shi X, Zhang R, Harder RJ, Cha W, Highland MJ, Frith MG, Assoufid L, Cherukara MJ
Publikováno v:
Optics express [Opt Express] 2023 Nov 20; Vol. 31 (24), pp. 39514-39527.
Autor:
Sheyfer D; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States.; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Mariano RG; Department of Chemistry, Stanford University, Stanford, California94305, United States.; Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts02141, United States., Kawaguchi T; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States.; Institute for Materials Research, Tohoku University, Sendai, 9808577, Japan., Cha W; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Harder RJ; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Kanan MW; Department of Chemistry, Stanford University, Stanford, California94305, United States., Hruszkewycz SO; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., You H; Materials Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States., Highland MJ; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois60439, United States.
Publikováno v:
Nano letters [Nano Lett] 2023 Jan 11; Vol. 23 (1), pp. 1-7. Date of Electronic Publication: 2022 Dec 21.
Autor:
Yang D; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK., Lapington MT; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK., He G; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK., Song K; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK., Zhang M; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK., Barker C; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK., Harder RJ; Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA., Cha W; Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA., Liu W; Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA., Phillips NW; Paul Scherrer Institut, 5232 Villigen PSI, Switzerland., Hofmann F; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK.
Publikováno v:
Journal of applied crystallography [J Appl Crystallogr] 2022 Sep 06; Vol. 55 (Pt 5), pp. 1184-1195. Date of Electronic Publication: 2022 Sep 06 (Print Publication: 2022).
Autor:
Yang D; Department of Engineering Science, University of Oxford Oxford OX1 3PJ UK david.yang@eng.ox.ac.uk felix.hofmann@eng.ox.ac.uk., Phillips NW; Department of Engineering Science, University of Oxford Oxford OX1 3PJ UK david.yang@eng.ox.ac.uk felix.hofmann@eng.ox.ac.uk., Song K; Department of Engineering Science, University of Oxford Oxford OX1 3PJ UK david.yang@eng.ox.ac.uk felix.hofmann@eng.ox.ac.uk., Barker C; Department of Materials, University of Oxford Oxford OX1 3PH UK., Harder RJ; Advanced Photon Source, Argonne National Laboratory Argonne IL 60439 USA., Cha W; Advanced Photon Source, Argonne National Laboratory Argonne IL 60439 USA., Liu W; Advanced Photon Source, Argonne National Laboratory Argonne IL 60439 USA., Hofmann F; Department of Engineering Science, University of Oxford Oxford OX1 3PJ UK david.yang@eng.ox.ac.uk felix.hofmann@eng.ox.ac.uk.
Publikováno v:
CrystEngComm [CrystEngComm] 2022 Jan 21; Vol. 24 (7), pp. 1334-1343. Date of Electronic Publication: 2022 Jan 21 (Print Publication: 2022).
Autor:
Yang D; Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, United Kingdom., Phillips NW; Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, United Kingdom., Song K; Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, United Kingdom., Harder RJ; Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA., Cha W; Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA., Hofmann F; Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, United Kingdom.
Publikováno v:
Journal of synchrotron radiation [J Synchrotron Radiat] 2021 Mar 01; Vol. 28 (Pt 2), pp. 550-565. Date of Electronic Publication: 2021 Feb 19.