Výsledky vyhledávání - "Hansen, Thomas W."

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Beam induced heating in electron microscopy modeled with machine learning interatomic potentials

Autor: Valencia, Cuauhtemoc Nuñez, Lomholdt, William Bang, Larsen, Matthew Helmi Leth, Hansen, Thomas W., Schiøtz, Jakob

Publikováno v: Nanoscale 16, 5750 (2024)

We develop a combined theoretical and experimental method for estimating the amount of heating that occurs in metallic nanoparticles that are being imaged in an electron microscope. We model the thermal transport between the nanoparticle and the supp

Externí odkaz: http://arxiv.org/abs/2309.16239

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Quantifying Noise Limitations of Neural Network Segmentations in High-Resolution Transmission Electron Microscopy

Autor: Larsen, Matthew Helmi Leth, Lomholdt, William Bang, Valencia, Cuauhtemoc Nuñez, Hansen, Thomas W., Schiøtz, Jakob

Publikováno v: Ultramicroscopy 253, (2023) 113803

Motivated by the need for low electron dose transmission electron microscopy imaging, we report the optimal frame dose (i.e. $e^-/A^{2}$) range for object detection and segmentation tasks with neural networks. The MSD-net architecture shows promising

Externí odkaz: http://arxiv.org/abs/2302.12629

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Reconstructing the exit wave in high-resolution transmission electron microscopy using machine learning

Autor: Larsen, Matthew Helmi Leth, Dahl, Frederik, Hansen, Lars P., Barton, Bastian, Kisielowski, Christian, Helveg, Stig, Winther, Ole, Hansen, Thomas W., Schiøtz, Jakob

Publikováno v: Ultramicroscopy 243, 113641 (2023)

Reconstruction of the exit wave function is an important route to interpreting high-resolution transmission electron microscopy (HRTEM) images. Here we demonstrate that convolutional neural networks can be used to reconstruct the exit wave from a sho

Externí odkaz: http://arxiv.org/abs/2112.14308

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