Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Hans Martin Von Staudt"'
Autor:
Michael Laisne, Alfred Crouch, Michele Portolan, Martin Keim, Hans Martin Von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0876c43e15bd73a7dd7331af2be35a6
https://doi.org/10.1109/itc50671.2022.00084
https://doi.org/10.1109/itc50671.2022.00084
Autor:
Hans Martin Von Staudt, Franz Schuler, Rohitaswa Bhattacharya, Justin Wei-Lin Cheng, Cheng-Da Huang, Parker Chih-Chun Chen
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8320a63d2ff7feb4374e4db34b39f59a
https://doi.org/10.1109/itc50671.2022.00088
https://doi.org/10.1109/itc50671.2022.00088
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3714bb035cda5ec01767f8d350a5de65
https://doi.org/10.1109/itc50671.2022.00045
https://doi.org/10.1109/itc50671.2022.00045
Publikováno v:
IEEE European Test Symposium (ETS 2021)
IEEE European Test Symposium (ETS 2021), May 2021, Bruges, Belgium. ⟨10.1109/ETS50041.2021.9465438⟩
IEEELink
ETS
IEEE European Test Symposium (ETS 2021), May 2021, Bruges, Belgium. ⟨10.1109/ETS50041.2021.9465438⟩
IEEELink
ETS
International audience; The industry is moving forward with non-TAP, chip-level interfaces driving IEEE 1687-2014 networks. Recent literature not only describes such interfaces, like I 2 C and IEEE 1149.7 variants, but also demonstrates that such int
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1253dd372450e0c0b07e5f67a10835f0
https://hal.archives-ouvertes.fr/hal-03432437
https://hal.archives-ouvertes.fr/hal-03432437
Publikováno v:
ITC
IJTAG (IEEE 1687) has proven to successfully address the challenge of test integration for “digital instruments” in digital systems on chip (SoCs). Yet, beyond SoCs, mixed signal IP presents an even bigger obstacle. This is particularly true for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ad34904103821179c3cbf703ba29814
https://doi.org/10.1109/itc44778.2020.9325267
https://doi.org/10.1109/itc44778.2020.9325267
Publikováno v:
VTS
There is a growing demand for low-cost and effective test solutions to support state-of-the-art analog and mixed-signal systems that are continuously increasing in complexity and functionality, while decreasing in product cost. This innovative practi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53fb3f6356a356c69f37d8c6b5efc2a5
https://doi.org/10.1109/vts.2019.8758607
https://doi.org/10.1109/vts.2019.8758607
Publikováno v:
VTS
The IEEE 1687–2014 standard introduced the concept of portable, retargetable tests for digital circuits and taught how to apply them via a JTAG Test Access Port. Two follow-on standardization efforts address the topics of portable, retargetable ana
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5dfd6d4d5a2772d42075781e704b1338
https://doi.org/10.1109/vts.2019.8758629
https://doi.org/10.1109/vts.2019.8758629
Publikováno v:
ITC
Many analog and mixed signal devices have very few or no digital pins. In spite of this, these products can be highly complex internally, including significant digital content. They may contain various sensors and control circuitry, which react to a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4b5b6fee3827bfbb413b23e667b79ff
https://doi.org/10.1109/test.2017.8242069
https://doi.org/10.1109/test.2017.8242069
Publikováno v:
2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW).
Demand for analogue precision and accuracy has significantly increased over the last few years, way beyond what the foundries can produce. At the same time short design cycles require the addition of digital configuration, trim, or assist functions t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::258748f3989794df58c328755a746b47
https://doi.org/10.1109/ims3tw.2015.7177859
https://doi.org/10.1109/ims3tw.2015.7177859
Publikováno v:
Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME).
Summary form only given: Shrinking feature sizes in IC manufacturing are required for implementing Moore's law of doubling device density. Higher device density enables increasing digital IC performance. For mixed-signal ICs, shrinking transistor siz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6844c4b5c7653ab282326d002e6e2586
https://doi.org/10.1109/prime.2013.6603143
https://doi.org/10.1109/prime.2013.6603143