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pro vyhledávání: '"Hans Krügerc"'
Autor:
N. Wermes, Fabian Hügging, Laura Gonella, Hans Krügerc, Vladimir Cindro, Andrej Gorišek, Bojan Hiti, Marko Mikuž, Igor Mandić, M. Zavrtanik, Gregor Kramberger, David-leon Pohl, Tomasz Hemperek, Michael Daas
Charge collection properties of depleted CMOS pixel detector prototypes produced on p-type substrate of 2 kΩ cm initial resistivity (by LFoundry 150 nm process) were studied using Edge-TCT method before and after neutron irradiation. The test struct
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1313500615fd4776929a99a3efed0737
http://arxiv.org/abs/1701.05033
http://arxiv.org/abs/1701.05033
