Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Hannes Behmenburg"'
Autor:
Eleonora Secco, Heruy Taddese Mengistu, Jaime Segura-Ruíz, Gema Martínez-Criado, Alberto García-Cristóbal, Andrés Cantarero, Bartosz Foltynski, Hannes Behmenburg, Christoph Giesen, Michael Heuken, Núria Garro
Publikováno v:
Nanomaterials, Vol 9, Iss 5, p 691 (2019)
Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity witho
Externí odkaz:
https://doaj.org/article/47b180213ebd4b00bd0ec823080151e1
Autor:
Sven Besendörfer, Hannes Behmenburg, Jochen Friedrich, Tobias Erlbacher, Holger Kalisch, Dirk Fahle, Hady Yacoub, Andrei Vescan, Elke Meissner, Thorsten Zweipfennig
Publikováno v:
AIP Advances
AIP Advances, Vol 10, Iss 4, Pp 045028-045028-6 (2020)
AIP Advances 10(4), 045028 (2020). doi:10.1063/1.5141905
AIP Advances, Vol 10, Iss 4, Pp 045028-045028-6 (2020)
AIP Advances 10(4), 045028 (2020). doi:10.1063/1.5141905
AIP Advances 10(4), 045028 (2020). doi:10.1063/1.5141905
Published by American Inst. of Physics, New York, NY
Published by American Inst. of Physics, New York, NY
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17babc08065a2d2f01a5ee2fbac67c79
https://publica.fraunhofer.de/handle/publica/262275
https://publica.fraunhofer.de/handle/publica/262275
Autor:
M. Eickelkamp, Hady Yacoub, Michael Heuken, Holger Kalisch, Thorsten Zweipfennig, Gerrit Lükens, Dirk Fahle, Hannes Behmenburg, Andrei Vescan
Publikováno v:
IEEE Transactions on Electron Devices. 65:3192-3198
The impact of the extrinsic carbon doping level was investigated with the aim of finding the optimal level for GaN-on-Si HFETs. A tradeoff between the crystal quality degradation by carbon doping and dynamic properties of HFET structures was observed
Autor:
C. Giesen, J. Segura-Ruiz, Eleonora Secco, Michael Heuken, Núria Garro, Alberto García-Cristóbal, Hannes Behmenburg, Gema Martínez-Criado, Heruy Taddese Mengistu, Andrés Cantarero, Bartosz Foltynski
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
Nanomaterials
Volume 9
Issue 5
'Nanomaterials ', vol: 9, pages: 691-1-691-11 (2019)
Secco, Eleonora Mengistu, Heruy Taddese Segura-Ruiz, Jaime Martínez Criado, Gema García Cristóbal, Alberto Cantarero Sáez, Andrés Foltynski, Bartosz Behmenburg, Hannes Giesen, Christoph Heuken, Michael Garro Martínez, Núria 2019 Elemental distribution and structural characterization of GaN/InGaN core-shell single nanowires by hard X-ray synchrotron nanoprobes Nanomaterials 9 691
RODERIC. Repositorio Institucional de la Universitat de Valéncia
RODERIC: Repositorio Institucional de la Universitat de Valéncia
Nanomaterials, Vol 9, Iss 5, p 691 (2019)
instname
Nanomaterials
Volume 9
Issue 5
'Nanomaterials ', vol: 9, pages: 691-1-691-11 (2019)
Secco, Eleonora Mengistu, Heruy Taddese Segura-Ruiz, Jaime Martínez Criado, Gema García Cristóbal, Alberto Cantarero Sáez, Andrés Foltynski, Bartosz Behmenburg, Hannes Giesen, Christoph Heuken, Michael Garro Martínez, Núria 2019 Elemental distribution and structural characterization of GaN/InGaN core-shell single nanowires by hard X-ray synchrotron nanoprobes Nanomaterials 9 691
RODERIC. Repositorio Institucional de la Universitat de Valéncia
RODERIC: Repositorio Institucional de la Universitat de Valéncia
Nanomaterials, Vol 9, Iss 5, p 691 (2019)
Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity witho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5993b15171601af9c5e7b45f3420fdc1
http://hdl.handle.net/10261/182948
http://hdl.handle.net/10261/182948
Autor:
Michael Heuken, Arthur Beckers, Adam R. Boyd, Olivier Feron, Hannes Behmenburg, Clifford McAleese, J. O'Dowd
Publikováno v:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI.
We report the mass production of blue LEDs on dry-etched patterned sapphire substrates using the AIX R6 tool in a 31×4" configuration. The system was operated in a continuous run mode, i.e. cleaning the showerhead after a series of LED runs. Product
Autor:
Gottfried Strasser, Erhard Kohn, Dionyz Pogany, C. Giesen, D. Maier, A. Alexewicz, Hannes Behmenburg, Michael Heuken, Mohammed Alomari
Publikováno v:
Solid-State Electronics. 89:207-211
The impact of surface treatment of 5 nm in situ SiN passivation on the performance of InAlGaN/GaN high electron mobility transistors is analyzed. After operation at 600 °C, no device degradation is observed, confirming the thermal stability of the p
Publikováno v:
physica status solidi c. 10:840-843
Enhancement mode GaN-based devices can be realised i.a. by gate recessing or the utilisation of a thin barrier. Yet, as this concept bases upon an increase in barrier capacitance, the application of a gate dielectric causing a capacitance reduction r
Publikováno v:
physica status solidi c. 10:799-802
An important issue in multi-step epitaxial growth processes are the electrical characteristics of regrown interfaces. Here, we present a study on interface quality and its effect onto insulating behavior and scattering effects in planar transistors.
Autor:
Ulrich Simon, V. Balmes, Andrei Vescan, C. Mauder, Michael Heuken, Ö. Tuna, Benjamin S. Gutrath, M. V. Rzheutskii, Holger Kalisch, Michael Noyong, Hannes Behmenburg, E. V. Lutsenko, G. P. Yablonskii
Publikováno v:
physica status solidi c. 9:964-967
We report on the metal organic vapour phase epitaxy (MOVPE) and characterization of n-type InGaN films for application in direct solar water splitting. The 40 nm thick films exhibit an In fraction of 15% and show good structural quality and a surface
Autor:
Rolf H. Jansen, Holger Kalisch, Michael Heuken, Hannes Behmenburg, C. Giesen, Rudolf Srnanek, Jaroslav Kováč
Publikováno v:
Journal of Crystal Growth. 316:42-45
In this paper, the influence of V/III molar flow ratio during AlN growth on SiC on growth mode and in-plane strain is investigated. AlN layers of ∼300 nm thickness were grown by metal-organic vapor phase epitaxy (MOVPE) on semi-insulating 6H-SiC an