Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Hanling Li"'
Autor:
Xuanrong Chen, Yi Shao, Wanqing Wei, Shimiao Zhu, Yang Li, Yutong Chen, Hanling Li, Hao Tian, Guijiang Sun, Yuanjie Niu, Zhiqun Shang
Publikováno v:
Cell Death and Disease, Vol 13, Iss 11, Pp 1-13 (2022)
Abstract Androgen receptor (AR) plays an important role in the progression of prostate cancer and has been targeted by castration or AR-antagonists. The emergence of castration-resistant prostate cancer (CRPC) after androgen deprivation therapy (ADT)
Externí odkaz:
https://doaj.org/article/822d4ef4bc5845b59b5f8e66707030c9
Autor:
Xuanrong Chen, Yi Shao, Wanqing Wei, Shimiao Zhu, Yang Li, Yutong Chen, Hanling Li, Hao Tian, Guijiang Sun, Yuanjie Niu, Zhiqun Shang
Publikováno v:
Cell Death and Disease, Vol 14, Iss 10, Pp 1-1 (2023)
Externí odkaz:
https://doaj.org/article/b95d8b4b226749cf85762a6a8bd8d7c0
Publikováno v:
SSRN Electronic Journal.
Publikováno v:
2022 IEEE International Conference on Mechatronics and Automation (ICMA).
Autor:
Dongyan Zhao, Yubo Wang, Yanning Chen, Jin Shao, Luo Wang, Yali Shao, Kelu Hua, Hanling Li, Jing Zhou, Jingbo Zeng
Publikováno v:
2022 IEEE 5th International Electrical and Energy Conference (CIEEC).
Autor:
Dongyan Zhao, Yubo Wang, Yanning Chen, Zhen Fu, Luo Wang, Yali Shao, Kelu Hua, Hanling Li, Jing Zhou, Yifeng Peng
Publikováno v:
2022 IEEE 5th International Electrical and Energy Conference (CIEEC).
Autor:
Dongyan Zhao, Yubo Wang, Jin Shao, Zhen Fu, Luo Wang, Yali Shao, Kelu Hua, Hanling Li, Jing Zhou, Linxin Jiang
Publikováno v:
2022 IEEE 5th International Electrical and Energy Conference (CIEEC).
Publikováno v:
Nanotechnology Reviews, Vol 10, Iss 1, Pp 178-186 (2021)
Sintered carbon nanotube (CNT) blocks and porous CNT sponges were prepared, and their thermoelectric properties were measured. The maximum dimensionless thermoelectric figure-of-merit, ZT, at room temperature of the sintered single-walled carbon nano
Publikováno v:
Eighth Symposium on Novel Photoelectronic Detection Technology and Applications.
Publikováno v:
In Journal of Systems Engineering and Electronics 2008 19(5):952-958