Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Hangkyu Lee"'
Autor:
Youjin Kim, Si Woo Lee, Hyejin Wang, Ryeong-Hyeon Kim, Hyun Ki Park, Hangkyu Lee, Eun Seok Kang
Publikováno v:
Diabetes & Metabolism Journal, Vol 46, Iss 2, Pp 337-348 (2022)
Background We investigated the antidiabetic effects of DA-1241, a novel G protein-coupled receptor (GPR) 119 agonist, in vitro and in vivo. Methods DA-1241 was administrated to high-fat diet (HFD)-fed C57BL/6J mice for 12 weeks after hyperglycaemia d
Externí odkaz:
https://doaj.org/article/9b3ace8d67ba4b4b8ca3cbd16ce17b8d
Autor:
Youjin Kim, Si Woo Lee, Hyejin Wang, Ryeong-Hyeon Kim, Hyun Ki Park, Hangkyu Lee, Eun Seok Kang
Publikováno v:
Diabetesmetabolism journal. 46(2)
Background: We investigated the antidiabetic effects of DA-1241, a novel G protein-coupled receptor (GPR) 119 agonist, in vitro and in vivo.Methods: DA-1241 was administrated to high-fat diet (HFD)-fed C57BL/6J mice for 12 weeks after hyperglycaemia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::84ca32845db32abe4186b72faccf81de
https://pubmed.ncbi.nlm.nih.gov/35052026
https://pubmed.ncbi.nlm.nih.gov/35052026
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 27:583-587
It was shown before that tests applied under nonfunctional operation conditions, which are made possible by scanning in an unreachable state, may lead to unnecessary yield loss. To address this issue, functional broadside tests were defined as broads
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f588de2559b8d4824a0c7c6e368f85b
https://doi.org/10.1109/tcad.2008.915531
https://doi.org/10.1109/tcad.2008.915531
Publikováno v:
DFT
The process of debugging timing failures requires the selection of a small set of high-quality tests which can excite critical paths and cause a circuit to fail at as low a frequency as possible. Since the primary source of such vectors are functiona
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fbf1dce857b755cfeb9ae122256e10a8
https://doi.org/10.1109/dft.2006.57
https://doi.org/10.1109/dft.2006.57
Publikováno v:
VTS
We present a test generation procedure for transition faults that minimizes the detection of functionally redundant transition faults in scan circuits. The procedure uses broadside testing. We also propose rules for identifying dominance relations be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca139feb3f94577ad3e6667e38d3d1c5
https://doi.org/10.1109/vts.2006.13
https://doi.org/10.1109/vts.2006.13
Publikováno v:
ISQED
We propose a new scan BIST method for transition faults. The method uses a Markov source for test pattern generation. We develop this method for skewed-load testing as well as for broadside testing. In the design of a Markov source for transition fau
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2133ee388526cb9896b3bdf46d723d03
https://doi.org/10.1109/isqed.2004.1283722
https://doi.org/10.1109/isqed.2004.1283722
Autor:
Sungho Kang, Hangkyu Lee
Publikováno v:
ICCD
In weighted random pattern testing based on deterministic test patterns, if the number of the deterministic test patterns with a low sampling probability is reduced, the number of the weighted random patterns required to achieve a high fault coverage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::099715850350a5181b86ba4281053924
https://doi.org/10.1109/iccd.1999.808421
https://doi.org/10.1109/iccd.1999.808421
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Mar2008, Vol. 27 Issue 3, p583-587. 5p.
Publikováno v:
2006 21st IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems; 2006, p59-70, 12p
Autor:
Hangkyu Lee, Sungho Kang
Publikováno v:
Proceedings 1999 IEEE International Conference on Computer Design: VLSI in Computers & Processors (Cat No99CB37040); 1999, p160-165, 6p