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pro vyhledávání: '"Han Sol Back"'
Autor:
Min Je Kim, Do Hwan Kim, Gyojic Shin, Kyung Ho Choi, Jeong Ju Baek, Han Sol Back, Jeong Ho Cho
Publikováno v:
RSC Advances. 9:3169-3175
We fabricated a high-quality perhydropolysilazane (PHPS)-derived SiO2 film by intense pulsed UV irradiation and applied it as a gate dielectric layer in high-performance organic field-effect transistors (OFETs) and complementary inverters. The conver
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::348f03bd05d2a6ac65cd7e380e4c1560
https://doi.org/10.1039/c8ra09831j
https://doi.org/10.1039/c8ra09831j
